Response to comment on "The local structure of amorphous silicon"

Michael Treacy, K. B. Borisenko

Research output: Contribution to journalComment/debate

9 Scopus citations

Abstract

The averaged diffraction data alone cannot distinguish between models with different heterogeneous structures at length scales of about 2 nanometers, even when using high-resolution data. Although our approach to calculating diffraction intensities from the model differs from that of Roorda and Lewis, paracrystallinity in amorphous silicon is undeniably evident in the raw experimental fluctuation electron microscopy data.

Original languageEnglish (US)
Pages (from-to)1539-c
JournalScience
Volume338
Issue number6114
DOIs
StatePublished - Dec 21 2012

ASJC Scopus subject areas

  • General

Fingerprint Dive into the research topics of 'Response to comment on "The local structure of amorphous silicon"'. Together they form a unique fingerprint.

  • Cite this