Response to comment on "The local structure of amorphous silicon"

Michael Treacy, K. B. Borisenko

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

The averaged diffraction data alone cannot distinguish between models with different heterogeneous structures at length scales of about 2 nanometers, even when using high-resolution data. Although our approach to calculating diffraction intensities from the model differs from that of Roorda and Lewis, paracrystallinity in amorphous silicon is undeniably evident in the raw experimental fluctuation electron microscopy data.

Original languageEnglish (US)
JournalScience
Volume338
Issue number6114
DOIs
StatePublished - Dec 21 2012

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amorphous silicon
diffraction
electron microscopy
high resolution

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  • General

Cite this

Response to comment on "The local structure of amorphous silicon". / Treacy, Michael; Borisenko, K. B.

In: Science, Vol. 338, No. 6114, 21.12.2012.

Research output: Contribution to journalArticle

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