Resonance Raman scattering in semiconductors and semiconductor microstructures

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Resonance Raman Scattering is a unique form of modulation spectroscopy that uses the material's phonons rather than externally supplied agents to modulate the electronic structure. We review the applications of this technique to semiconducting materials. Special emphasis is given to research on quantum well and superlattice systems, particularly to phonon localization effects and to analysis of resonant profiles.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsFred H. Pollak, Manuel Cardona, David E. Aspnes
Place of PublicationBellingham, WA, United States
PublisherPubl by Int Soc for Optical Engineering
Pages275-279
Number of pages5
Volume1286
ISBN (Print)0819403377
StatePublished - 1990
EventInternational Conference on Modulation Spectroscopy - San Diego, CA, USA
Duration: Mar 19 1990Mar 21 1990

Other

OtherInternational Conference on Modulation Spectroscopy
CitySan Diego, CA, USA
Period3/19/903/21/90

Fingerprint

resonance scattering
Raman scattering
phonons
quantum wells
Raman spectra
Semiconductor materials
electronic structure
modulation
microstructure
Microstructure
Phonons
profiles
Semiconductor quantum wells
spectroscopy
Electronic structure
Modulation
Spectroscopy

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Menendez, J. (1990). Resonance Raman scattering in semiconductors and semiconductor microstructures. In F. H. Pollak, M. Cardona, & D. E. Aspnes (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 1286, pp. 275-279). Bellingham, WA, United States: Publ by Int Soc for Optical Engineering.

Resonance Raman scattering in semiconductors and semiconductor microstructures. / Menendez, Jose.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / Fred H. Pollak; Manuel Cardona; David E. Aspnes. Vol. 1286 Bellingham, WA, United States : Publ by Int Soc for Optical Engineering, 1990. p. 275-279.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Menendez, J 1990, Resonance Raman scattering in semiconductors and semiconductor microstructures. in FH Pollak, M Cardona & DE Aspnes (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 1286, Publ by Int Soc for Optical Engineering, Bellingham, WA, United States, pp. 275-279, International Conference on Modulation Spectroscopy, San Diego, CA, USA, 3/19/90.
Menendez J. Resonance Raman scattering in semiconductors and semiconductor microstructures. In Pollak FH, Cardona M, Aspnes DE, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 1286. Bellingham, WA, United States: Publ by Int Soc for Optical Engineering. 1990. p. 275-279
Menendez, Jose. / Resonance Raman scattering in semiconductors and semiconductor microstructures. Proceedings of SPIE - The International Society for Optical Engineering. editor / Fred H. Pollak ; Manuel Cardona ; David E. Aspnes. Vol. 1286 Bellingham, WA, United States : Publ by Int Soc for Optical Engineering, 1990. pp. 275-279
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