Resolution enhancement by deconvolution using a field emission source in electron energy loss spectroscopy

P. E. Batson; D. W. Johnson; John Spence

doi:10.1016/0304-3991(92)90103-Q

Resolution enhancement by deconvolution using a field emission source in electron energy loss spectroscopy

P. E. Batson, D. W. Johnson, John Spence

Physics

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38 Scopus citations

Abstract

The noise penalties of the following resolution-enhancement procedures are compared: (a) deconvolution when the apparatus function is smooth, (b) deconvolution when the apparatus function possesses a step discontinuity, and (c) physically reducing the experimental "slit width" or its equivalent. It is shown that it is not feasible to very significantly increase resolution by deconvolution when the apparatus function is smooth. The method (c) achieves a given resolution increase with the smallest noise increase of these methods. However, method (b) is feasible when the source distribution possesses a discontinuity, and the apparatus resolution is good. This occurs naturally when using a field emission source in electron energy loss spectroscopy. Using the Fermi-level cut-off as a discontinuity in the source distribution, we use method (b) above to obtain deconvoluted data which is limited only by the spectrometer resolution.

Original language	English (US)
Pages (from-to)	137-145
Number of pages	9
Journal	Ultramicroscopy
Volume	41
Issue number	1-3
DOIs	https://doi.org/10.1016/0304-3991(92)90103-Q
State	Published - 1992

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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10.1016/0304-3991(92)90103-Q

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@article{90c3b475713941d6a09bf2571667b4cf,

title = "Resolution enhancement by deconvolution using a field emission source in electron energy loss spectroscopy",

abstract = "The noise penalties of the following resolution-enhancement procedures are compared: (a) deconvolution when the apparatus function is smooth, (b) deconvolution when the apparatus function possesses a step discontinuity, and (c) physically reducing the experimental {"}slit width{"} or its equivalent. It is shown that it is not feasible to very significantly increase resolution by deconvolution when the apparatus function is smooth. The method (c) achieves a given resolution increase with the smallest noise increase of these methods. However, method (b) is feasible when the source distribution possesses a discontinuity, and the apparatus resolution is good. This occurs naturally when using a field emission source in electron energy loss spectroscopy. Using the Fermi-level cut-off as a discontinuity in the source distribution, we use method (b) above to obtain deconvoluted data which is limited only by the spectrometer resolution.",

author = "Batson, {P. E.} and Johnson, {D. W.} and John Spence",

note = "Funding Information: One of us (D.W.J) wishes to acknowledge the support of a Commonwealth Post Graduate Re- search Award, the Australian Atomic Energy Commission and the Australian Research Grants Commission. We also thank Dr. A.E.C. Spargo for his useful comments and encouragement in this work. Supported by NSF award DMR91-12550 (J.C.H.S., P.I.).",

year = "1992",

doi = "10.1016/0304-3991(92)90103-Q",

language = "English (US)",

volume = "41",

pages = "137--145",

journal = "Ultramicroscopy",

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T1 - Resolution enhancement by deconvolution using a field emission source in electron energy loss spectroscopy

AU - Batson, P. E.

AU - Johnson, D. W.

AU - Spence, John

N1 - Funding Information: One of us (D.W.J) wishes to acknowledge the support of a Commonwealth Post Graduate Re- search Award, the Australian Atomic Energy Commission and the Australian Research Grants Commission. We also thank Dr. A.E.C. Spargo for his useful comments and encouragement in this work. Supported by NSF award DMR91-12550 (J.C.H.S., P.I.).

PY - 1992

Y1 - 1992

N2 - The noise penalties of the following resolution-enhancement procedures are compared: (a) deconvolution when the apparatus function is smooth, (b) deconvolution when the apparatus function possesses a step discontinuity, and (c) physically reducing the experimental "slit width" or its equivalent. It is shown that it is not feasible to very significantly increase resolution by deconvolution when the apparatus function is smooth. The method (c) achieves a given resolution increase with the smallest noise increase of these methods. However, method (b) is feasible when the source distribution possesses a discontinuity, and the apparatus resolution is good. This occurs naturally when using a field emission source in electron energy loss spectroscopy. Using the Fermi-level cut-off as a discontinuity in the source distribution, we use method (b) above to obtain deconvoluted data which is limited only by the spectrometer resolution.

AB - The noise penalties of the following resolution-enhancement procedures are compared: (a) deconvolution when the apparatus function is smooth, (b) deconvolution when the apparatus function possesses a step discontinuity, and (c) physically reducing the experimental "slit width" or its equivalent. It is shown that it is not feasible to very significantly increase resolution by deconvolution when the apparatus function is smooth. The method (c) achieves a given resolution increase with the smallest noise increase of these methods. However, method (b) is feasible when the source distribution possesses a discontinuity, and the apparatus resolution is good. This occurs naturally when using a field emission source in electron energy loss spectroscopy. Using the Fermi-level cut-off as a discontinuity in the source distribution, we use method (b) above to obtain deconvoluted data which is limited only by the spectrometer resolution.

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U2 - 10.1016/0304-3991(92)90103-Q

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JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 1-3

ER -

Resolution enhancement by deconvolution using a field emission source in electron energy loss spectroscopy

Abstract

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