Resolution and image fidelty in STEM and TEM (HREM)

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)236-237
Number of pages2
JournalMicroscopy and Microanalysis
Volume11
Issue numberSUPPL. 2
DOIs
StatePublished - 2005
Externally publishedYes

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High resolution electron microscopy
Transmission electron microscopy
transmission electron microscopy

ASJC Scopus subject areas

  • Instrumentation

Cite this

Resolution and image fidelty in STEM and TEM (HREM). / Spence, John.

In: Microscopy and Microanalysis, Vol. 11, No. SUPPL. 2, 2005, p. 236-237.

Research output: Contribution to journalArticle

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