Requirements driven falsification with coverage metrics

Adel Dokhanchi, Aditya Zutshi, Rahul T. Sriniva, Sriram Sankaranarayanan, Georgios Fainekos

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

Specication guided falsication methods for hybrid systems have recently demonstrated their value in detecting design errors in models of safety critical systems. In specication guided falsication, the correctness problem, i.e., does the system satisfy the specication, is converted into an optimization problem where local negative minima indicate design errors. Due to the complexity of the resulting optimization problem, the problem is solved iteratively by performing a number of simulations on the system. Even though it is theoretically guaranteed that falsication methods will eventually find the bugs in the system, in practice, the performance of these methods, i.e., how many tests/simulations are executed before a bug is detected, depends on the specication, on the system and on the optimization method. In this paper, we define and utilize coverage metrics on the state space of hybrid systems in order to improve the performance of the falsication methods.

Original languageEnglish (US)
Title of host publication2015 Proceedings of the International Conference on Embedded Software, EMSOFT 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages31-40
Number of pages10
ISBN (Print)9781467380799
DOIs
StatePublished - Nov 4 2015
Event13th International Conference on Embedded Software, EMSOFT 2015 - Amsterdam, Netherlands
Duration: Oct 4 2015Oct 9 2015

Other

Other13th International Conference on Embedded Software, EMSOFT 2015
CountryNetherlands
CityAmsterdam
Period10/4/1510/9/15

Fingerprint

Hybrid systems

Keywords

  • Aerospace electronics
  • Measurement
  • Robustness
  • Semantics
  • Testing
  • Trajectory
  • Yttrium

ASJC Scopus subject areas

  • Software

Cite this

Dokhanchi, A., Zutshi, A., Sriniva, R. T., Sankaranarayanan, S., & Fainekos, G. (2015). Requirements driven falsification with coverage metrics. In 2015 Proceedings of the International Conference on Embedded Software, EMSOFT 2015 (pp. 31-40). [7318257] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EMSOFT.2015.7318257

Requirements driven falsification with coverage metrics. / Dokhanchi, Adel; Zutshi, Aditya; Sriniva, Rahul T.; Sankaranarayanan, Sriram; Fainekos, Georgios.

2015 Proceedings of the International Conference on Embedded Software, EMSOFT 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 31-40 7318257.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Dokhanchi, A, Zutshi, A, Sriniva, RT, Sankaranarayanan, S & Fainekos, G 2015, Requirements driven falsification with coverage metrics. in 2015 Proceedings of the International Conference on Embedded Software, EMSOFT 2015., 7318257, Institute of Electrical and Electronics Engineers Inc., pp. 31-40, 13th International Conference on Embedded Software, EMSOFT 2015, Amsterdam, Netherlands, 10/4/15. https://doi.org/10.1109/EMSOFT.2015.7318257
Dokhanchi A, Zutshi A, Sriniva RT, Sankaranarayanan S, Fainekos G. Requirements driven falsification with coverage metrics. In 2015 Proceedings of the International Conference on Embedded Software, EMSOFT 2015. Institute of Electrical and Electronics Engineers Inc. 2015. p. 31-40. 7318257 https://doi.org/10.1109/EMSOFT.2015.7318257
Dokhanchi, Adel ; Zutshi, Aditya ; Sriniva, Rahul T. ; Sankaranarayanan, Sriram ; Fainekos, Georgios. / Requirements driven falsification with coverage metrics. 2015 Proceedings of the International Conference on Embedded Software, EMSOFT 2015. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 31-40
@inproceedings{c6ded0861d10432bb1d9c25076808b69,
title = "Requirements driven falsification with coverage metrics",
abstract = "Specication guided falsication methods for hybrid systems have recently demonstrated their value in detecting design errors in models of safety critical systems. In specication guided falsication, the correctness problem, i.e., does the system satisfy the specication, is converted into an optimization problem where local negative minima indicate design errors. Due to the complexity of the resulting optimization problem, the problem is solved iteratively by performing a number of simulations on the system. Even though it is theoretically guaranteed that falsication methods will eventually find the bugs in the system, in practice, the performance of these methods, i.e., how many tests/simulations are executed before a bug is detected, depends on the specication, on the system and on the optimization method. In this paper, we define and utilize coverage metrics on the state space of hybrid systems in order to improve the performance of the falsication methods.",
keywords = "Aerospace electronics, Measurement, Robustness, Semantics, Testing, Trajectory, Yttrium",
author = "Adel Dokhanchi and Aditya Zutshi and Sriniva, {Rahul T.} and Sriram Sankaranarayanan and Georgios Fainekos",
year = "2015",
month = "11",
day = "4",
doi = "10.1109/EMSOFT.2015.7318257",
language = "English (US)",
isbn = "9781467380799",
pages = "31--40",
booktitle = "2015 Proceedings of the International Conference on Embedded Software, EMSOFT 2015",
publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - GEN

T1 - Requirements driven falsification with coverage metrics

AU - Dokhanchi, Adel

AU - Zutshi, Aditya

AU - Sriniva, Rahul T.

AU - Sankaranarayanan, Sriram

AU - Fainekos, Georgios

PY - 2015/11/4

Y1 - 2015/11/4

N2 - Specication guided falsication methods for hybrid systems have recently demonstrated their value in detecting design errors in models of safety critical systems. In specication guided falsication, the correctness problem, i.e., does the system satisfy the specication, is converted into an optimization problem where local negative minima indicate design errors. Due to the complexity of the resulting optimization problem, the problem is solved iteratively by performing a number of simulations on the system. Even though it is theoretically guaranteed that falsication methods will eventually find the bugs in the system, in practice, the performance of these methods, i.e., how many tests/simulations are executed before a bug is detected, depends on the specication, on the system and on the optimization method. In this paper, we define and utilize coverage metrics on the state space of hybrid systems in order to improve the performance of the falsication methods.

AB - Specication guided falsication methods for hybrid systems have recently demonstrated their value in detecting design errors in models of safety critical systems. In specication guided falsication, the correctness problem, i.e., does the system satisfy the specication, is converted into an optimization problem where local negative minima indicate design errors. Due to the complexity of the resulting optimization problem, the problem is solved iteratively by performing a number of simulations on the system. Even though it is theoretically guaranteed that falsication methods will eventually find the bugs in the system, in practice, the performance of these methods, i.e., how many tests/simulations are executed before a bug is detected, depends on the specication, on the system and on the optimization method. In this paper, we define and utilize coverage metrics on the state space of hybrid systems in order to improve the performance of the falsication methods.

KW - Aerospace electronics

KW - Measurement

KW - Robustness

KW - Semantics

KW - Testing

KW - Trajectory

KW - Yttrium

UR - http://www.scopus.com/inward/record.url?scp=84962323549&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84962323549&partnerID=8YFLogxK

U2 - 10.1109/EMSOFT.2015.7318257

DO - 10.1109/EMSOFT.2015.7318257

M3 - Conference contribution

SN - 9781467380799

SP - 31

EP - 40

BT - 2015 Proceedings of the International Conference on Embedded Software, EMSOFT 2015

PB - Institute of Electrical and Electronics Engineers Inc.

ER -