Report on the 2022 Embedded Systems Week (ESWEEK)

Aviral Shrivastava; Xiaobo Sharon Hu

doi:10.1109/MDAT.2022.3222451

Report on the 2022 Embedded Systems Week (ESWEEK)

Engineering, Ira A. Fulton Schools of (IAFSE)

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	108-111
Number of pages	4
Journal	IEEE Design and Test
Volume	40
Issue number	1
DOIs	https://doi.org/10.1109/MDAT.2022.3222451
State	Published - Feb 1 2023

ASJC Scopus subject areas

Software
Hardware and Architecture
Electrical and Electronic Engineering

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10.1109/MDAT.2022.3222451

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@article{2f98e0636d2a4d429428eae98a415ed2,

title = "Report on the 2022 Embedded Systems Week (ESWEEK)",

author = "Aviral Shrivastava and Hu, {Xiaobo Sharon}",

year = "2023",

month = feb,

day = "1",

doi = "10.1109/MDAT.2022.3222451",

language = "English (US)",

volume = "40",

pages = "108--111",

journal = "IEEE Design and Test",

issn = "2168-2356",

publisher = "IEEE Computer Society",

number = "1",

}

TY - JOUR

T1 - Report on the 2022 Embedded Systems Week (ESWEEK)

AU - Shrivastava, Aviral

AU - Hu, Xiaobo Sharon

PY - 2023/2/1

Y1 - 2023/2/1

UR - http://www.scopus.com/inward/record.url?scp=85147709636&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85147709636&partnerID=8YFLogxK

U2 - 10.1109/MDAT.2022.3222451

DO - 10.1109/MDAT.2022.3222451

M3 - Article

AN - SCOPUS:85147709636

SN - 2168-2356

VL - 40

SP - 108

EP - 111

JO - IEEE Design and Test

JF - IEEE Design and Test

IS - 1

ER -

Report on the 2022 Embedded Systems Week (ESWEEK)

ASJC Scopus subject areas

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