Reply to "Comment on 'A unified explanation for secondary ion yields' and 'Mechanism of the SIMS matrix effect"'

P. Williams, V. R. Deline, C. A. Evans, W. Katz

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

Comments made in the preceding paper are critically discussed. It is argued that conclusions reached in our earlier papers were conservative and justified within our experimental accuracy. Negative-ion yields under cesium bombardment scale with surface cesium concentration and electron affinity in a manner analogous to the scaling of positive-ion yields with surface oxygen concentration and ionization potential. Fluorine is shown to be an exception, due probably to saturation effects.

Original languageEnglish (US)
Pages (from-to)530-532
Number of pages3
JournalJournal of Applied Physics
Volume52
Issue number1
DOIs
StatePublished - Dec 1 1981
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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