Reply to "Comment on 'A unified explanation for secondary ion yields' and 'Mechanism of the SIMS matrix effect"'

P. Williams, V. R. Deline, C. A. Evans, W. Katz

Research output: Contribution to journalArticle

6 Scopus citations


Comments made in the preceding paper are critically discussed. It is argued that conclusions reached in our earlier papers were conservative and justified within our experimental accuracy. Negative-ion yields under cesium bombardment scale with surface cesium concentration and electron affinity in a manner analogous to the scaling of positive-ion yields with surface oxygen concentration and ionization potential. Fluorine is shown to be an exception, due probably to saturation effects.

Original languageEnglish (US)
Pages (from-to)530-532
Number of pages3
JournalJournal of Applied Physics
Issue number1
StatePublished - Dec 1 1981


ASJC Scopus subject areas

  • Physics and Astronomy(all)

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