Reliability studies of AlGaN/GaN high electron mobility transistors

D. J. Cheney, E. A. Douglas, L. Liu, C. F. Lo, Y. Y. Xi, B. P. Gila, F. Ren, David Horton, M. E. Law, David Smith, S. J. Pearton

Research output: Contribution to journalArticlepeer-review

34 Scopus citations

Fingerprint

Dive into the research topics of 'Reliability studies of AlGaN/GaN high electron mobility transistors'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy