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Reliability studies of AlGaN/GaN high electron mobility transistors
D. J. Cheney, E. A. Douglas, L. Liu, C. F. Lo, Y. Y. Xi, B. P. Gila, F. Ren, David Horton, M. E. Law, David Smith, S. J. Pearton
Research output: Contribution to journal › Article › peer-review
47
Scopus
citations