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Reliability of GaN HEMTs: Current degradation in GaN/AlGaN/AlN/GaN HEMT
Balaji Padmanabhan, Dragica Vasileska, Stephen Goodnick
- Electrical Engineering
- Computational Nanoscience, Center for (CCN)
- Solid State Electronics Research Center (CSSER)
- Nano-Electronics, Arizona Institute of (AINE)
- Photonics Innovation, Center for (CPhI)
- Electrical, Computer, and Energy Engineering, School of (IAFSE-ECEE)
- Materials Science and Engineering
- Adaptive Neural Systems, Center for (ANS)
- Single Molecule Biophysics, Center for (SMB)
- Engineering, Ira A. Fulton Schools of (IAFSE)
- Knowledge Enterprise (KE)
- Biodesign Institute
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
6
Scopus
citations