2 Scopus citations

Abstract

Failure due to aging mechanisms is an important concern for RF circuits. In-field aging results in continuous degradation of circuit performances before they cause catastrophic failures. In this regard, the lifetime of RF/analog circuits, which is defined as the point where at least one specification fails, is not just determined by aging at the device level, but also by the slack in the specifications, process variations, and the stress conditions on each of the devices. In this paper, we present a methodology for analyzing, monitoring, and mitigating performance degradation in cross-coupled LC oscillators caused by aging mechanisms in MOSFET devices. At design time, we identify reliability hot spots and concentrate our efforts on improving these components. We aim at altering degradation patterns of important performance parameters, thereby improving the lifetime of the circuit with low area and no performance impact. We use simulations based on verified aging models to evaluate the monitoring and mitigation techniques and show that the proposed methods can increase the lifetime of the devices with no impact on the initial performance.

Original languageEnglish (US)
Title of host publicationProceedings - 2014 IEEE 32nd VLSI Test Symposium, VTS 2014
PublisherIEEE Computer Society
ISBN (Print)9781479926114
DOIs
StatePublished - Jan 1 2014
Event2014 IEEE 32nd VLSI Test Symposium, VTS 2014 - Napa, CA, United States
Duration: Apr 13 2014Apr 17 2014

Publication series

NameProceedings of the IEEE VLSI Test Symposium

Other

Other2014 IEEE 32nd VLSI Test Symposium, VTS 2014
CountryUnited States
CityNapa, CA
Period4/13/144/17/14

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ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Chang, D., Ozev, S., Bakkaloglu, B., Kiaei, S., Afacan, E., & Dundar, G. (2014). Reliability enhancement using in-field monitoring and recovery for RF circuits. In Proceedings - 2014 IEEE 32nd VLSI Test Symposium, VTS 2014 [6818774] (Proceedings of the IEEE VLSI Test Symposium). IEEE Computer Society. https://doi.org/10.1109/VTS.2014.6818774