2 Citations (Scopus)

Abstract

Failure due to aging mechanisms is an important concern for RF circuits. In-field aging results in continuous degradation of circuit performances before they cause catastrophic failures. In this regard, the lifetime of RF/analog circuits, which is defined as the point where at least one specification fails, is not just determined by aging at the device level, but also by the slack in the specifications, process variations, and the stress conditions on each of the devices. In this paper, we present a methodology for analyzing, monitoring, and mitigating performance degradation in cross-coupled LC oscillators caused by aging mechanisms in MOSFET devices. At design time, we identify reliability hot spots and concentrate our efforts on improving these components. We aim at altering degradation patterns of important performance parameters, thereby improving the lifetime of the circuit with low area and no performance impact. We use simulations based on verified aging models to evaluate the monitoring and mitigation techniques and show that the proposed methods can increase the lifetime of the devices with no impact on the initial performance.

Original languageEnglish (US)
Title of host publicationProceedings of the IEEE VLSI Test Symposium
PublisherIEEE Computer Society
ISBN (Print)9781479926114
DOIs
StatePublished - 2014
Event2014 IEEE 32nd VLSI Test Symposium, VTS 2014 - Napa, CA, United States
Duration: Apr 13 2014Apr 17 2014

Other

Other2014 IEEE 32nd VLSI Test Symposium, VTS 2014
CountryUnited States
CityNapa, CA
Period4/13/144/17/14

Fingerprint

Aging of materials
Recovery
Networks (circuits)
Monitoring
Degradation
Specifications
Analog circuits
MOSFET devices

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Computer Science Applications

Cite this

Chang, D., Ozev, S., Bakkaloglu, B., Kiaei, S., Afacan, E., & Dundar, G. (2014). Reliability enhancement using in-field monitoring and recovery for RF circuits. In Proceedings of the IEEE VLSI Test Symposium [6818774] IEEE Computer Society. https://doi.org/10.1109/VTS.2014.6818774

Reliability enhancement using in-field monitoring and recovery for RF circuits. / Chang, Doohwang; Ozev, Sule; Bakkaloglu, Bertan; Kiaei, Sayfe; Afacan, Engin; Dundar, Gunhan.

Proceedings of the IEEE VLSI Test Symposium. IEEE Computer Society, 2014. 6818774.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chang, D, Ozev, S, Bakkaloglu, B, Kiaei, S, Afacan, E & Dundar, G 2014, Reliability enhancement using in-field monitoring and recovery for RF circuits. in Proceedings of the IEEE VLSI Test Symposium., 6818774, IEEE Computer Society, 2014 IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, United States, 4/13/14. https://doi.org/10.1109/VTS.2014.6818774
Chang D, Ozev S, Bakkaloglu B, Kiaei S, Afacan E, Dundar G. Reliability enhancement using in-field monitoring and recovery for RF circuits. In Proceedings of the IEEE VLSI Test Symposium. IEEE Computer Society. 2014. 6818774 https://doi.org/10.1109/VTS.2014.6818774
Chang, Doohwang ; Ozev, Sule ; Bakkaloglu, Bertan ; Kiaei, Sayfe ; Afacan, Engin ; Dundar, Gunhan. / Reliability enhancement using in-field monitoring and recovery for RF circuits. Proceedings of the IEEE VLSI Test Symposium. IEEE Computer Society, 2014.
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