Reliability Analysis of Field-aged Glass/Glass PV Modules: Influence of Different Encapsulant Types

Prathamesh Manohar Thorat, Shreyas Prasad Waghmare, Archana Sinha, Akash Kumar, Govinda Samy Tamizhmani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a preliminary reliability analysis of field-aged glass/glass (G/G) PV modules. Several characterization tests were performed on more than 60 modules with two different encapsulant types (EVA and ionomer) exposed in hot-dry Arizona (AZ) climate over 10-35 years. The common degradation mode observed in both encapsulant types was the delamination of encapsulant along with encapsulant browning (EVA only), glass cracking (EVA only), and metallic corrosion over junction box area (ionomer only). The EVA encapsulated G/G modules showed the higher median power degradation rate at 0.91-1.99%/yr whereas modules with ionomer showed the lower at 0.21%/yr.

Original languageEnglish (US)
Title of host publication2020 47th IEEE Photovoltaic Specialists Conference, PVSC 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1816-1822
Number of pages7
ISBN (Electronic)9781728161150
DOIs
StatePublished - Jun 14 2020
Event47th IEEE Photovoltaic Specialists Conference, PVSC 2020 - Calgary, Canada
Duration: Jun 15 2020Aug 21 2020

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
Volume2020-June
ISSN (Print)0160-8371

Conference

Conference47th IEEE Photovoltaic Specialists Conference, PVSC 2020
CountryCanada
CityCalgary
Period6/15/208/21/20

Keywords

  • browning
  • delamination
  • encapsulant degradation
  • field exposed
  • glass/glass
  • reliability

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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