Reliability Analysis of Field-aged Glass/Glass PV Modules: Influence of Different Encapsulant Types

Prathamesh Manohar Thorat; Shreyas Prasad Waghmare; Archana Sinha; Akash Kumar; Govinda Samy Tamizhmani

doi:10.1109/PVSC45281.2020.9300551

Reliability Analysis of Field-aged Glass/Glass PV Modules: Influence of Different Encapsulant Types

Prathamesh Manohar Thorat, Shreyas Prasad Waghmare, Archana Sinha, Akash Kumar, Govinda Samy Tamizhmani

Polytechnic Engineering Programs (EGR)

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

8 Scopus citations

Abstract

This paper presents a preliminary reliability analysis of field-aged glass/glass (G/G) PV modules. Several characterization tests were performed on more than 60 modules with two different encapsulant types (EVA and ionomer) exposed in hot-dry Arizona (AZ) climate over 10-35 years. The common degradation mode observed in both encapsulant types was the delamination of encapsulant along with encapsulant browning (EVA only), glass cracking (EVA only), and metallic corrosion over junction box area (ionomer only). The EVA encapsulated G/G modules showed the higher median power degradation rate at 0.91-1.99%/yr whereas modules with ionomer showed the lower at 0.21%/yr.

Original language	English (US)
Title of host publication	2020 47th IEEE Photovoltaic Specialists Conference, PVSC 2020
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1816-1822
Number of pages	7
ISBN (Electronic)	9781728161150
DOIs	https://doi.org/10.1109/PVSC45281.2020.9300551
State	Published - Jun 14 2020
Event	47th IEEE Photovoltaic Specialists Conference, PVSC 2020 - Calgary, Canada Duration: Jun 15 2020 → Aug 21 2020

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
Volume	2020-June
ISSN (Print)	0160-8371

Conference

Conference	47th IEEE Photovoltaic Specialists Conference, PVSC 2020
Country/Territory	Canada
City	Calgary
Period	6/15/20 → 8/21/20

Keywords

browning
delamination
encapsulant degradation
field exposed
glass/glass
reliability

ASJC Scopus subject areas

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/PVSC45281.2020.9300551

Cite this

Thorat, P. M., Waghmare, S. P., Sinha, A., Kumar, A., & Tamizhmani, G. S. (2020). Reliability Analysis of Field-aged Glass/Glass PV Modules: Influence of Different Encapsulant Types. In 2020 47th IEEE Photovoltaic Specialists Conference, PVSC 2020 (pp. 1816-1822). Article 9300551 (Conference Record of the IEEE Photovoltaic Specialists Conference; Vol. 2020-June). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC45281.2020.9300551

Reliability Analysis of Field-aged Glass/Glass PV Modules: Influence of Different Encapsulant Types. / Thorat, Prathamesh Manohar; Waghmare, Shreyas Prasad; Sinha, Archana et al.
2020 47th IEEE Photovoltaic Specialists Conference, PVSC 2020. Institute of Electrical and Electronics Engineers Inc., 2020. p. 1816-1822 9300551 (Conference Record of the IEEE Photovoltaic Specialists Conference; Vol. 2020-June).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Thorat, PM, Waghmare, SP, Sinha, A, Kumar, A & Tamizhmani, GS 2020, Reliability Analysis of Field-aged Glass/Glass PV Modules: Influence of Different Encapsulant Types. in 2020 47th IEEE Photovoltaic Specialists Conference, PVSC 2020., 9300551, Conference Record of the IEEE Photovoltaic Specialists Conference, vol. 2020-June, Institute of Electrical and Electronics Engineers Inc., pp. 1816-1822, 47th IEEE Photovoltaic Specialists Conference, PVSC 2020, Calgary, Canada, 6/15/20. https://doi.org/10.1109/PVSC45281.2020.9300551

Thorat PM, Waghmare SP, Sinha A, Kumar A, Tamizhmani GS. Reliability Analysis of Field-aged Glass/Glass PV Modules: Influence of Different Encapsulant Types. In 2020 47th IEEE Photovoltaic Specialists Conference, PVSC 2020. Institute of Electrical and Electronics Engineers Inc. 2020. p. 1816-1822. 9300551. (Conference Record of the IEEE Photovoltaic Specialists Conference). doi: 10.1109/PVSC45281.2020.9300551

Thorat, Prathamesh Manohar ; Waghmare, Shreyas Prasad ; Sinha, Archana et al. / Reliability Analysis of Field-aged Glass/Glass PV Modules : Influence of Different Encapsulant Types. 2020 47th IEEE Photovoltaic Specialists Conference, PVSC 2020. Institute of Electrical and Electronics Engineers Inc., 2020. pp. 1816-1822 (Conference Record of the IEEE Photovoltaic Specialists Conference).

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abstract = "This paper presents a preliminary reliability analysis of field-aged glass/glass (G/G) PV modules. Several characterization tests were performed on more than 60 modules with two different encapsulant types (EVA and ionomer) exposed in hot-dry Arizona (AZ) climate over 10-35 years. The common degradation mode observed in both encapsulant types was the delamination of encapsulant along with encapsulant browning (EVA only), glass cracking (EVA only), and metallic corrosion over junction box area (ionomer only). The EVA encapsulated G/G modules showed the higher median power degradation rate at 0.91-1.99%/yr whereas modules with ionomer showed the lower at 0.21%/yr.",

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Reliability Analysis of Field-aged Glass/Glass PV Modules: Influence of Different Encapsulant Types

Abstract

Publication series

Conference

Keywords

ASJC Scopus subject areas

Access to Document

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