This paper presents an extension of reliability analysis of electronic devices with multiple competing failure modes involving performance aging degradation. The probability that a product fails on a specific mode is derived. Using this probability, the dominant failure mode on the product can be predicted. A practical example is presented to analyze an electronic device with two kinds of major failure modes-solder/Cu pad interface fracture (a catastrophic failure) and light intensity degradation (a degradation failure). Reliability modeling of an individual failure mode and device reliability analysis is presented and results are discussed.
- Competing failure modes
- Electronic devices
- Performance aging degradation
- Weibull distribution
ASJC Scopus subject areas
- Safety, Risk, Reliability and Quality
- Management Science and Operations Research