Reliability analysis of electronic devices with multiple competing failure modes involving performance aging degradation

Wei Huang, Ronald Askin

Research output: Contribution to journalArticle

103 Scopus citations

Abstract

This paper presents an extension of reliability analysis of electronic devices with multiple competing failure modes involving performance aging degradation. The probability that a product fails on a specific mode is derived. Using this probability, the dominant failure mode on the product can be predicted. A practical example is presented to analyze an electronic device with two kinds of major failure modes-solder/Cu pad interface fracture (a catastrophic failure) and light intensity degradation (a degradation failure). Reliability modeling of an individual failure mode and device reliability analysis is presented and results are discussed.

Original languageEnglish (US)
Pages (from-to)241-254
Number of pages14
JournalQuality and Reliability Engineering International
Volume19
Issue number3
DOIs
StatePublished - May 1 2003

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Keywords

  • Competing failure modes
  • Electronic devices
  • Performance aging degradation
  • Reliability
  • Weibull distribution

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Management Science and Operations Research

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