Reliability analysis for dependent competing failure processes with two-stage degradation and external shocks

Yukun Wang, Guanqi Fang, Rong Pan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint

Dive into the research topics of 'Reliability analysis for dependent competing failure processes with two-stage degradation and external shocks'. Together they form a unique fingerprint.

Engineering & Materials Science

Social Sciences