Relativistic effects in core-loss electron diffraction

Christian Dwyer, Jonathan S. Barnard

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

We present experimental evidence of relativistic fine structure in inelastic electron diffraction patterns of a crystalline solid at zone-axis orientation. Diffraction patterns formed by 200 keV electrons suffering energy losses within 10 eV of the silicon K -ionization edge at 001 zone axis exhibit excellent agreement with a relativistic theory of atomic ionization. Such agreement provides experimental confirmation of the theoretical approach, used in an earlier investigation, suggesting that relativistic effects should be taken into account when performing quantitative core-loss spectroscopy on individual atomic columns in the scanning transmission electron microscope.

Original languageEnglish (US)
Article number064106
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume74
Issue number6
DOIs
StatePublished - 2006
Externally publishedYes

Fingerprint

relativistic effects
Electron diffraction
Diffraction patterns
Ionization
diffraction patterns
electron diffraction
ionization
relativistic theory
Silicon
Crystal orientation
Energy dissipation
Electron microscopes
electron microscopes
energy dissipation
fine structure
Spectroscopy
electron energy
Crystalline materials
Scanning
scanning

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Relativistic effects in core-loss electron diffraction. / Dwyer, Christian; Barnard, Jonathan S.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 74, No. 6, 064106, 2006.

Research output: Contribution to journalArticle

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