Regional influence on module design quality: Qualification testing failure rate results from six regional labs of TUV rheinland around the world

G. Tamizhmani, B. Li, B. Shisler, C. Monokroussos, C. Dreier, S. Lim, Cs Kamalaksha, S. Sugita, E. Janknecht

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Qualification testing of photovoltaic modules, according to IEC 61215 or IEC 61646 standard, is generally considered as a minimum requirement for reliability. Between 2011 and 2013, there was an immense price pressure on PV module manufacturers; this price pressure has steered many manufacturers to cutting corners with poor quality materials or introducing unqualified materials. These changes in the module design and materials could increase the warranty claim rate and shatter the traditional minimal recall history of PV modules. This paper analyzes the influence of these material changes on the crystalline silicon module design quality from two perspectives: (i) Design variation between regions; (ii) Design evolution over 16 years. The analysis presented in this paper is based on the test results obtained on several thousands of modules in the six regional labs of TÜV Rheinland around the world.

Original languageEnglish (US)
Title of host publication2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages3580-3584
Number of pages5
ISBN (Electronic)9781479943982
DOIs
StatePublished - Oct 15 2014
Event40th IEEE Photovoltaic Specialist Conference, PVSC 2014 - Denver, United States
Duration: Jun 8 2014Jun 13 2014

Publication series

Name2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014

Other

Other40th IEEE Photovoltaic Specialist Conference, PVSC 2014
CountryUnited States
CityDenver
Period6/8/146/13/14

Keywords

  • IEC 61215
  • accelerated testing
  • failure
  • qualification testing
  • reliability testing

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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    Tamizhmani, G., Li, B., Shisler, B., Monokroussos, C., Dreier, C., Lim, S., Kamalaksha, C., Sugita, S., & Janknecht, E. (2014). Regional influence on module design quality: Qualification testing failure rate results from six regional labs of TUV rheinland around the world. In 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014 (pp. 3580-3584). [6924880] (2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2014.6924880