Region based containers - A new paradigm for the analysis of fault tolerant networks

Prashant D. Joshi, Arunabha Sen, D. Frank Hsu, Said Hamdioui, Koen Bertels

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Network Fault Tolerance has classically focused on the connectivity of the underlying graph of the network. A k-connected graph will tolerate up to k-1 node or edge failures allowing the remaining nodes to still communicate between them. The introduction of 'Containers' of the underlying graph enabled the measurement of the graceful degradation of the remaining network with the removal of faulty nodes and edges. This metric was required to bound the diameter degradation of the network. Recently, another major metric 'Region Based Connectivity', was introduced to study the locality of the faults in network robustness, by studying the resilience of networks with the loss of regions instead of individual nodes. Since real life networks often have localized outages, it is important to study losses of regions at a time. In this study, we introduce a new concept called 'Region Based Containers' of graphs. This framework will enable the analysis of fault tolerant networks where the two paradigms are brought together to study the graceful degradation of networks when multiple regions are affected. In this paper we propose a framework for network QoS using Region Based Containers and its application to fault tolerant design of networks. We then describe an example of networks built by regular Extended Line Graphs and present tight bounds in network degradation with multiple region failures. In the example the diameter of these networks degrade by at most one, despite the failure of d-1 regions where d is the regular degree of the network. The upper bounds on the size of these regions is presented. This metric is especially applicable to networks where faults are either localized by nature, or faults tend to result in cascading errors in their vicinity, such as power distribution networks, server clusters, or in extreme environments where redundancy of paths is necessary rather than a bonus.

Original languageEnglish (US)
Title of host publication2017 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-4
Number of pages4
ISBN (Electronic)9781538603628
DOIs
StatePublished - Jun 28 2017
Event13th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017 - Cambridge, United Kingdom
Duration: Oct 23 2017Oct 25 2017

Publication series

Name2017 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017
Volume2018-January

Other

Other13th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017
Country/TerritoryUnited Kingdom
CityCambridge
Period10/23/1710/25/17

Keywords

  • Extended Une Graphs
  • Fault Tolerant Networks
  • Graph Containers
  • Region Based Connectivity
  • diameter degradation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Hardware and Architecture

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