Reflection phase characterization of curved high impedance surfaces

Ahmet C. Durgun, Constantine Balanis, Craig R. Birtcher

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Reflection phase characteristics of cylindrically curved high impedance surfaces (HISs) are examined. Due to the non-periodicity of the problem, full wave solutions can be time consuming. To overcome this problem, an approximate semi-analytical method, which assumes a homogenized model for the curved HIS, is developed. The model parameters can be extracted from the reflection properties of the flat HIS. For the cases where only Floquet currents are excited, the reflection phase diagram of a curved HIS is independent of the curvature. However, the surface waves generated on HISs, due to their periodic geometry, distorts their reflection phase characteristics within specific frequency intervals. In those intervals, the reflection phase changes as a function of radius of curvature and size of the HIS. These effects are not observed for the flat cases because of the lower radiation resistance of the surface waves. In this paper, the normal incidence case is considered for TE and TM polarizations.

Original languageEnglish (US)
Article number6605491
Pages (from-to)6030-6038
Number of pages9
JournalIEEE Transactions on Antennas and Propagation
Volume61
Issue number12
DOIs
StatePublished - Dec 2013

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impedance
Surface waves
surface waves
curvature
intervals
radiation tolerance
Phase diagrams
incidence
phase diagrams
Polarization
Radiation
radii
Geometry
polarization
geometry

Keywords

  • Curved HIS
  • Electromagnetic band gap (EBG)
  • High impedance surfaces (HIS)
  • Surface waves

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Reflection phase characterization of curved high impedance surfaces. / Durgun, Ahmet C.; Balanis, Constantine; Birtcher, Craig R.

In: IEEE Transactions on Antennas and Propagation, Vol. 61, No. 12, 6605491, 12.2013, p. 6030-6038.

Research output: Contribution to journalArticle

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