Reflection high-energy electron diffraction during substrate rotation: A new dimension for in situ characterization

W. Braun, H. Möller, Yong-Hang Zhang

Research output: Contribution to journalArticlepeer-review

35 Scopus citations

Fingerprint

Dive into the research topics of 'Reflection high-energy electron diffraction during substrate rotation: A new dimension for in situ characterization'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy