2 Citations (Scopus)

Abstract

Reflection electron microscopy (REM) and reflection high energy electron diffraction (RHEED) were used in a UHV electron microscope to study the effects of various surface treatments on the topography and crystal structure of cleaved GaP(110) surfaces. Reported ion-milling and annealing cleaning treatments resulted in rough surface topography, and in good 1 × 1 RHEED patterns. Annealing at 800°C resulted in surface smoothing, but also led to dissociation of GaP with viscous flow of a Ga-rich molten phase on the surface. Regions on the surface which were not covered by the molten phase maintained the 1 × 1 reconstruction typical of the clean GaP(110) surface.

Original languageEnglish (US)
Pages (from-to)1062-1066
Number of pages5
JournalSurface Science
Volume287-288
Issue numberPART 2
DOIs
StatePublished - May 10 1993

Fingerprint

Electron microscopy
electron microscopy
Transmission electron microscopy
transmission electron microscopy
Reflection high energy electron diffraction
Molten materials
high energy electrons
Electron reflection
Annealing
topography
electron diffraction
Surface topography
Viscous flow
annealing
Topography
Diffraction patterns
viscous flow
Surface treatment
Cleaning
surface treatment

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Reflection electron microscopy studies of GaP(110) surfaces in UHV-TEM. / Gajdardziska-Josifovska, M.; McCartney, Martha; Smith, David.

In: Surface Science, Vol. 287-288, No. PART 2, 10.05.1993, p. 1062-1066.

Research output: Contribution to journalArticle

Gajdardziska-Josifovska, M. ; McCartney, Martha ; Smith, David. / Reflection electron microscopy studies of GaP(110) surfaces in UHV-TEM. In: Surface Science. 1993 ; Vol. 287-288, No. PART 2. pp. 1062-1066.
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