Abstract
A scanning tunneling microscope (STM) has been operated inside the Philips EM 400T transmission electron microscope (TEM). The possibility of combining STM with dark-field reflection electron microscopy (REM) has been confirmed. Preliminary results using the STM for REM in a TEM indicate that this combination has the potential to be a powerful new technique for studying surfaces and for studying the basic physics of STM. The STM holder has been successfully used to obtain REM images while tunneling from the same region. The incident electron beam and the STM instrument do not appear to influence the imaging modes of each other appreciably. The tunneling gap and surface modifications due to tip contact have also been observed by REM. The calibration of the deflection of the tube type STM scanner by electron microscope images is reported. The effects of hydrocarbon contamination on STM operation in air or conventional vacuum have been studied.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2745-2751 |
| Number of pages | 7 |
| Journal | Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films |
| Volume | 7 |
| Issue number | 4 |
| DOIs | |
| State | Published - Jul 1989 |
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films