Abstract
This paper presents a technique that uses a linear projection of images and other processing steps to arrive at a one-dimensional multiplierless correlation. This operation is used to detect the presence or absence of surface mounted devices (SMDs) in the inspection of printed circuit boards. Images with two types of illuminations are processed to produce two different decision schemes: one to detect component presence and the other to detect component absence. Additionally, the use of wavelet decomposition is examined in this paper as a pre-processing step in feature extraction, from which classification can be made.
| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation |
| Editors | Anon |
| Place of Publication | Piscataway, NJ, United States |
| Publisher | IEEE |
| Pages | 30-36 |
| Number of pages | 7 |
| State | Published - 1996 |
| Externally published | Yes |
| Event | Proceedings of the 1996 IEEE Southwest Symposium on Image Analysis and Interpretation - San Antonio, TX, USA Duration: Apr 8 1996 → Apr 9 1996 |
Other
| Other | Proceedings of the 1996 IEEE Southwest Symposium on Image Analysis and Interpretation |
|---|---|
| City | San Antonio, TX, USA |
| Period | 4/8/96 → 4/9/96 |
ASJC Scopus subject areas
- Computer Vision and Pattern Recognition
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Cite this
Gallegos, J. M., Villalobos, J., Carrillo, G., & Cabrera, S. D. (1996). Reduced-dimension and wavelet processing of SMD images for real-time inspection. In Anon (Ed.), Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation (pp. 30-36). IEEE.