Reduced-dimension and wavelet processing of SMD images for real-time inspection

J. Mario Gallegos; Jesus Villalobos; Gerardo Carrillo; Sergio D. Cabrera

Reduced-dimension and wavelet processing of SMD images for real-time inspection

J. Mario Gallegos, Jesus Villalobos, Gerardo Carrillo, Sergio D. Cabrera

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This paper presents a technique that uses a linear projection of images and other processing steps to arrive at a one-dimensional multiplierless correlation. This operation is used to detect the presence or absence of surface mounted devices (SMDs) in the inspection of printed circuit boards. Images with two types of illuminations are processed to produce two different decision schemes: one to detect component presence and the other to detect component absence. Additionally, the use of wavelet decomposition is examined in this paper as a pre-processing step in feature extraction, from which classification can be made.

Original language	English (US)
Title of host publication	Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation
Editors	Anon
Place of Publication	Piscataway, NJ, United States
Publisher	IEEE
Pages	30-36
Number of pages	7
State	Published - 1996
Externally published	Yes
Event	Proceedings of the 1996 IEEE Southwest Symposium on Image Analysis and Interpretation - San Antonio, TX, USA Duration: Apr 8 1996 → Apr 9 1996

Other

Other	Proceedings of the 1996 IEEE Southwest Symposium on Image Analysis and Interpretation
City	San Antonio, TX, USA
Period	4/8/96 → 4/9/96

ASJC Scopus subject areas

Computer Vision and Pattern Recognition

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Reduced-dimension and wavelet processing of SMD images for real-time inspection. / Gallegos, J. Mario; Villalobos, Jesus; Carrillo, Gerardo; Cabrera, Sergio D.

Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation. ed. / Anon. Piscataway, NJ, United States : IEEE, 1996. p. 30-36.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Gallegos, JM, Villalobos, J, Carrillo, G & Cabrera, SD 1996, Reduced-dimension and wavelet processing of SMD images for real-time inspection. in Anon (ed.), Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation. IEEE, Piscataway, NJ, United States, pp. 30-36, Proceedings of the 1996 IEEE Southwest Symposium on Image Analysis and Interpretation, San Antonio, TX, USA, 4/8/96.

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author = "Gallegos, {J. Mario} and Jesus Villalobos and Gerardo Carrillo and Cabrera, {Sergio D.}",

year = "1996",

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AU - Carrillo, Gerardo

AU - Cabrera, Sergio D.

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Y1 - 1996

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AB - This paper presents a technique that uses a linear projection of images and other processing steps to arrive at a one-dimensional multiplierless correlation. This operation is used to detect the presence or absence of surface mounted devices (SMDs) in the inspection of printed circuit boards. Images with two types of illuminations are processed to produce two different decision schemes: one to detect component presence and the other to detect component absence. Additionally, the use of wavelet decomposition is examined in this paper as a pre-processing step in feature extraction, from which classification can be made.

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BT - Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation

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T2 - Proceedings of the 1996 IEEE Southwest Symposium on Image Analysis and Interpretation

Y2 - 8 April 1996 through 9 April 1996

ER -

Reduced-dimension and wavelet processing of SMD images for real-time inspection

Abstract

Other

ASJC Scopus subject areas

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