Reduced-dimension and wavelet processing of SMD images for real-time inspection

J. Mario Gallegos, Jesus Villalobos, Gerardo Carrillo, Sergio D. Cabrera

Research output: Chapter in Book/Report/Conference proceedingConference contribution

17 Scopus citations

Abstract

This paper presents a technique that uses a linear projection of images and other processing steps to arrive at a one-dimensional multiplierless correlation. This operation is used to detect the presence or absence of surface mounted devices (SMDs) in the inspection of printed circuit boards. Images with two types of illuminations are processed to produce two different decision schemes: one to detect component presence and the other to detect component absence. Additionally, the use of wavelet decomposition is examined in this paper as a pre-processing step in feature extraction, from which classification can be made.

Original languageEnglish (US)
Title of host publicationProceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation
Editors Anon
Place of PublicationPiscataway, NJ, United States
PublisherIEEE
Pages30-36
Number of pages7
StatePublished - 1996
Externally publishedYes
EventProceedings of the 1996 IEEE Southwest Symposium on Image Analysis and Interpretation - San Antonio, TX, USA
Duration: Apr 8 1996Apr 9 1996

Other

OtherProceedings of the 1996 IEEE Southwest Symposium on Image Analysis and Interpretation
CitySan Antonio, TX, USA
Period4/8/964/9/96

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition

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  • Cite this

    Gallegos, J. M., Villalobos, J., Carrillo, G., & Cabrera, S. D. (1996). Reduced-dimension and wavelet processing of SMD images for real-time inspection. In Anon (Ed.), Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation (pp. 30-36). IEEE.