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Dive into the research topics of 'Recovery in dc performance of off-state step-stressed AlGaN/GaN high electron mobility transistor with thermal annealing'. Together they form a unique fingerprint.- Sort by
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Byung Jae Kim, Shihyun Ahn, Tsung Sheng Kang, Junhao Zhu, Fan Ren, Stephen J. Pearton, David Smith
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution