Abstract
X-ray tomography has provided a non-destructive means for microstructure characterization in three and four dimensions. A stochastic procedure to accurately reconstruct material microstructure from limited-angle X-ray tomographic projections is presented and its utility is demonstrated by reconstructing a variety of distinct heterogeneous materials and elucidating the information content of different projection data sets. A small number of projections (e.g. 20-40) are necessary for accurate reconstructions via the stochastic procedure, indicating its high efficiency in using limited structural information.
Original language | English (US) |
---|---|
Pages (from-to) | 48-51 |
Number of pages | 4 |
Journal | Scripta Materialia |
Volume | 86 |
DOIs | |
State | Published - Sep 1 2014 |
Keywords
- Limited-angle projections
- Material microstructure
- Stochastic reconstruction
- X-ray tomography
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
- Metals and Alloys