Abstract

X-ray tomography has provided a non-destructive means for microstructure characterization in three and four dimensions. A stochastic procedure to accurately reconstruct material microstructure from limited-angle X-ray tomographic projections is presented and its utility is demonstrated by reconstructing a variety of distinct heterogeneous materials and elucidating the information content of different projection data sets. A small number of projections (e.g. 20-40) are necessary for accurate reconstructions via the stochastic procedure, indicating its high efficiency in using limited structural information.

Original languageEnglish (US)
Pages (from-to)48-51
Number of pages4
JournalScripta Materialia
Volume86
DOIs
StatePublished - Sep 1 2014

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Keywords

  • Limited-angle projections
  • Material microstructure
  • Stochastic reconstruction
  • X-ray tomography

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys

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