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Realizing crack-free high-aluminum-mole-fraction AlGaN on patterned GaN beyond the critical layer thickness
Frank Mehnke, Alec M. Fischer, Zhiyu Xu, Henri Bouchard, Theeradetch Detchprohm, Shyh Chiang Shen, Fernando A. Ponce, Russell D. Dupuis
Research output: Contribution to journal › Article › peer-review
5
Scopus
citations