Engineering & Materials Science
Semiconductor growth
100%
Spectroscopic ellipsometry
91%
Monitoring
28%
Epitaxial growth
17%
Metallorganic chemical vapor deposition
9%
Molecular beam epitaxy
9%
Buffer layers
8%
Thickness measurement
8%
Chemical analysis
8%
Uncertainty
7%
Heterojunction bipolar transistors
7%
X rays
5%
Wavelength
5%
Surface roughness
5%
Detectors
4%
Substrates
4%
Temperature
2%
Chemical Compounds
Ellipsometry
55%
Semiconductor
38%
Surface Temperature
9%
Epitaxial Growth
8%
Surface Roughness
7%
Wavelength
5%
Buffer Solution
4%
Surface
2%
Physics & Astronomy
ellipsometry
49%
barrier layers
6%
surface temperature
6%
accumulators
6%
metalorganic chemical vapor deposition
5%
surface roughness
5%
buffers
5%
methodology
5%
incidence
5%
oscillations
3%
shift
3%
detectors
3%
wavelengths
2%
x rays
2%