Rayleigh-scattering microscopy for tracking and sizing nanoparticles in focused aerosol beams

Max F. Hantke, Johan Bielecki, Olena Kulyk, Daniel Westphal, Daniel S.D. Larsson, Martin Svenda, Hemanth K.N. Reddy, Richard Kirian, Jakob Andreasson, Janos Hajdu, Filipe R.N.C. Maia

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