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Raman scattering for semiconductor interface analysis
R. J. Nemanich
Research output
:
Contribution to journal
›
Article
›
peer-review
1
Scopus citations
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Engineering & Materials Science
Raman scattering
75%
Ultrahigh vacuum
61%
Semiconductor materials
46%
Thin films
37%
Vacuum deposition
22%
Light interference
20%
Silicides
17%
Raman spectroscopy
17%
Crystalline materials
13%
Silicon
10%
Metals
8%
Mathematics
Raman Scattering
100%
Semiconductors
61%
Thin Films
27%
Vacuum
23%
Raman Spectroscopy
13%
Silicon
10%
Interference
8%
Metals
8%
Chemical Compounds
Interface Analysis
84%
Vacuum
41%
Semiconductor
39%
Raman Spectroscopy
13%
Amorphous Material
12%
Surface
5%
Application
5%
Physics & Astronomy
Raman spectra
40%
ultrahigh vacuum
22%
thin films
11%
vacuum deposition
9%
silicides
7%
Raman spectroscopy
6%
interference
5%
silicon
4%
metals
3%