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Raman scattering characterization of strain in gaas heteroepitaxial films grown on sapphire and silicon-on-sapphire substrates
T. P. Humphreys, J. B. Posthill, K. Das, C. A. Sukow, R. J. Nemanichi, N. R. Parikh, A. Majeed
Research output: Contribution to journal › Article › peer-review
10
Scopus
citations