Radiation effects studies on thin film TiO2 memristor devices

Erica Deionno, Mark D. Looper, Jon V. Osborn, Hugh Barnaby, William M. Tong

Research output: Chapter in Book/Report/Conference proceedingConference contribution

13 Scopus citations

Abstract

Memristor devices have been identified as potential replacements for a variety of memory applications and may also be suitable for space applications. In this work, we present a review of radiation testing on TiO2-based memristor devices. The experimental results from three previous studies are reviewed and coupled here with modeling to gain a more complete understanding of the energy deposition and resulting effects on the electrical performance of the device. In addition, we discuss the implications of having a nanometer scaled thin film device and how that affects the energy deposition from the various radiation sources.

Original languageEnglish (US)
Title of host publication2013 IEEE Aerospace Conference, AERO 2013
DOIs
StatePublished - Jun 12 2013
Event2013 IEEE Aerospace Conference, AERO 2013 - Big Sky, MT, United States
Duration: Mar 2 2013Mar 9 2013

Publication series

NameIEEE Aerospace Conference Proceedings
ISSN (Print)1095-323X

Other

Other2013 IEEE Aerospace Conference, AERO 2013
CountryUnited States
CityBig Sky, MT
Period3/2/133/9/13

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ASJC Scopus subject areas

  • Aerospace Engineering
  • Space and Planetary Science

Cite this

Deionno, E., Looper, M. D., Osborn, J. V., Barnaby, H., & Tong, W. M. (2013). Radiation effects studies on thin film TiO2 memristor devices. In 2013 IEEE Aerospace Conference, AERO 2013 [6497378] (IEEE Aerospace Conference Proceedings). https://doi.org/10.1109/AERO.2013.6497378