Radiation effects of high voltage MESFETs at the 45nm node

Seth J. Wilk; William Lepkowski; Bo Chen; Jason Kam; Michael Goryll; Keith Holbert; Trevor Thornton

doi:10.1109/REDW.2013.6658202

Radiation effects of high voltage MESFETs at the 45nm node

Seth J. Wilk, William Lepkowski, Bo Chen, Jason Kam, Michael Goryll, Keith Holbert, Trevor Thornton

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A high voltage MESFET transistor has been fabricated using a commercial 45nm SOI foundry. The device has a breakdown voltage >25X the nominal CMOS and is shown to be radiation tolerant to 1Mrad.

Original language	English (US)
Title of host publication	IEEE Radiation Effects Data Workshop
DOIs	https://doi.org/10.1109/REDW.2013.6658202
Publication status	Published - 2013
Event	2013 IEEE Radiation Effects Data Workshop, REDW 2013 - Held in Conjunction with the 50th IEEE Nuclear and Space Radiation Effects Conference, NSREC 2013 - San Francisco, CA, United States Duration: Jul 8 2013 → Jul 12 2013

Other

Other	2013 IEEE Radiation Effects Data Workshop, REDW 2013 - Held in Conjunction with the 50th IEEE Nuclear and Space Radiation Effects Conference, NSREC 2013
Country	United States
City	San Francisco, CA
Period	7/8/13 → 7/12/13

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ASJC Scopus subject areas

Electrical and Electronic Engineering
Radiation
Nuclear and High Energy Physics

Cite this

Wilk, S. J., Lepkowski, W., Chen, B., Kam, J., Goryll, M., Holbert, K., & Thornton, T. (2013). Radiation effects of high voltage MESFETs at the 45nm node. In IEEE Radiation Effects Data Workshop [6658202] https://doi.org/10.1109/REDW.2013.6658202

Wilk, SJ, Lepkowski, W, Chen, B, Kam, J, Goryll, M , Holbert, K & Thornton, T 2013, Radiation effects of high voltage MESFETs at the 45nm node. in IEEE Radiation Effects Data Workshop., 6658202, 2013 IEEE Radiation Effects Data Workshop, REDW 2013 - Held in Conjunction with the 50th IEEE Nuclear and Space Radiation Effects Conference, NSREC 2013, San Francisco, CA, United States, 7/8/13. https://doi.org/10.1109/REDW.2013.6658202

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AU - Holbert, Keith

AU - Thornton, Trevor

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BT - IEEE Radiation Effects Data Workshop

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Access to Document

10.1109/REDW.2013.6658202