RAD hardening commercial-off-the-shelf microcontrollers destined for I&C applications in severe nuclear environments

Keith Holbert, Lawrence T. Clark, Yitao Chen, Ian N. Zavatkay, James W. Adams

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint

Dive into the research topics of 'RAD hardening commercial-off-the-shelf microcontrollers destined for I&C applications in severe nuclear environments'. Together they form a unique fingerprint.

Engineering & Materials Science