RAD hardening commercial-off-the-shelf microcontrollers destined for I&C applications in severe nuclear environments

Keith Holbert, Lawrence T. Clark, Yitao Chen, Ian N. Zavatkay, James W. Adams

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Post nuclear accident conditions represent a harsh environment for electronics. Three Mile Island, Chernobyl, and Fukushima Daiichi show the necessity for emergency sensing capabilities in a radiation-enhanced environment. Each proved dangerous to workers trying to assess, control and mitigate the accidents. Robots were used in each case with limited success. Consequently, research into methods to extend the life of robots in a high radiation environment has become a priority for industry. Robotic systems can be utilized to inspect, repair, and monitor facilities within the entire nuclear fuel cycle. This paper investigates the total ionizing dose (TID) hardness of electronics using available technology employing commercial off-the-shelf devices and present generation circuit fabrication techniques. Our approach is to develop system level mitigation techniques for circuits destined for severe nuclear environments. We aim to increase the radiation resilience of sensitive electronics such that a robot could be employed for in-containment post-accident monitoring and sensing purposes.

Original languageEnglish (US)
Title of host publication9th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2015
PublisherAmerican Nuclear Society
Pages363-372
Number of pages10
Volume1
ISBN (Print)9781510808096
StatePublished - 2015
Event9th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2015 - Charlotte, United States
Duration: Feb 22 2015Feb 26 2015

Other

Other9th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2015
CountryUnited States
CityCharlotte
Period2/22/152/26/15

Fingerprint

Microcontrollers
Hardening
Accidents
Electronic equipment
Robots
Radiation
Networks (circuits)
Nuclear fuels
Robotics
Repair
Hardness
Fabrication
Monitoring
Industry

Keywords

  • Radiation dose
  • Radiation hardening by design

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Nuclear Energy and Engineering
  • Human-Computer Interaction

Cite this

Holbert, K., Clark, L. T., Chen, Y., Zavatkay, I. N., & Adams, J. W. (2015). RAD hardening commercial-off-the-shelf microcontrollers destined for I&C applications in severe nuclear environments. In 9th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2015 (Vol. 1, pp. 363-372). American Nuclear Society.

RAD hardening commercial-off-the-shelf microcontrollers destined for I&C applications in severe nuclear environments. / Holbert, Keith; Clark, Lawrence T.; Chen, Yitao; Zavatkay, Ian N.; Adams, James W.

9th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2015. Vol. 1 American Nuclear Society, 2015. p. 363-372.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Holbert, K, Clark, LT, Chen, Y, Zavatkay, IN & Adams, JW 2015, RAD hardening commercial-off-the-shelf microcontrollers destined for I&C applications in severe nuclear environments. in 9th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2015. vol. 1, American Nuclear Society, pp. 363-372, 9th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2015, Charlotte, United States, 2/22/15.
Holbert K, Clark LT, Chen Y, Zavatkay IN, Adams JW. RAD hardening commercial-off-the-shelf microcontrollers destined for I&C applications in severe nuclear environments. In 9th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2015. Vol. 1. American Nuclear Society. 2015. p. 363-372
Holbert, Keith ; Clark, Lawrence T. ; Chen, Yitao ; Zavatkay, Ian N. ; Adams, James W. / RAD hardening commercial-off-the-shelf microcontrollers destined for I&C applications in severe nuclear environments. 9th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2015. Vol. 1 American Nuclear Society, 2015. pp. 363-372
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