RAD hardening commercial-off-the-shelf microcontrollers destined for I&C applications in severe nuclear environments

Keith Holbert; Lawrence T. Clark; Yitao Chen; Ian N. Zavatkay; James W. Adams

RAD hardening commercial-off-the-shelf microcontrollers destined for I&C applications in severe nuclear environments

Keith Holbert, Lawrence T. Clark, Yitao Chen, Ian N. Zavatkay, James W. Adams

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Post nuclear accident conditions represent a harsh environment for electronics. Three Mile Island, Chernobyl, and Fukushima Daiichi show the necessity for emergency sensing capabilities in a radiation-enhanced environment. Each proved dangerous to workers trying to assess, control and mitigate the accidents. Robots were used in each case with limited success. Consequently, research into methods to extend the life of robots in a high radiation environment has become a priority for industry. Robotic systems can be utilized to inspect, repair, and monitor facilities within the entire nuclear fuel cycle. This paper investigates the total ionizing dose (TID) hardness of electronics using available technology employing commercial off-the-shelf devices and present generation circuit fabrication techniques. Our approach is to develop system level mitigation techniques for circuits destined for severe nuclear environments. We aim to increase the radiation resilience of sensitive electronics such that a robot could be employed for in-containment post-accident monitoring and sensing purposes.

Original language	English (US)
Title of host publication	9th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2015
Publisher	American Nuclear Society
Pages	363-372
Number of pages	10
Volume	1
ISBN (Print)	9781510808096
State	Published - 2015
Event	9th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2015 - Charlotte, United States Duration: Feb 22 2015 → Feb 26 2015

Other

Other	9th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2015
Country/Territory	United States
City	Charlotte
Period	2/22/15 → 2/26/15

Keywords

Radiation dose
Radiation hardening by design

ASJC Scopus subject areas

Energy Engineering and Power Technology
Nuclear Energy and Engineering
Human-Computer Interaction

Cite this

Holbert, K., Clark, L. T., Chen, Y., Zavatkay, I. N., & Adams, J. W. (2015). RAD hardening commercial-off-the-shelf microcontrollers destined for I&C applications in severe nuclear environments. In 9th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2015 (Vol. 1, pp. 363-372). American Nuclear Society.

RAD hardening commercial-off-the-shelf microcontrollers destined for I&C applications in severe nuclear environments. / Holbert, Keith; Clark, Lawrence T.; Chen, Yitao et al.
9th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2015. Vol. 1 American Nuclear Society, 2015. p. 363-372.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Holbert, K, Clark, LT, Chen, Y, Zavatkay, IN & Adams, JW 2015, RAD hardening commercial-off-the-shelf microcontrollers destined for I&C applications in severe nuclear environments. in 9th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2015. vol. 1, American Nuclear Society, pp. 363-372, 9th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2015, Charlotte, United States, 2/22/15.

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AB - Post nuclear accident conditions represent a harsh environment for electronics. Three Mile Island, Chernobyl, and Fukushima Daiichi show the necessity for emergency sensing capabilities in a radiation-enhanced environment. Each proved dangerous to workers trying to assess, control and mitigate the accidents. Robots were used in each case with limited success. Consequently, research into methods to extend the life of robots in a high radiation environment has become a priority for industry. Robotic systems can be utilized to inspect, repair, and monitor facilities within the entire nuclear fuel cycle. This paper investigates the total ionizing dose (TID) hardness of electronics using available technology employing commercial off-the-shelf devices and present generation circuit fabrication techniques. Our approach is to develop system level mitigation techniques for circuits destined for severe nuclear environments. We aim to increase the radiation resilience of sensitive electronics such that a robot could be employed for in-containment post-accident monitoring and sensing purposes.

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ER -

RAD hardening commercial-off-the-shelf microcontrollers destined for I&C applications in severe nuclear environments

Abstract

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Keywords

ASJC Scopus subject areas

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