Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope.

J. Tafto; P R Buseck

Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope.

J. Tafto, P R Buseck

Earth and Space Exploration, School of (SESE)

Research output: Contribution to journal › Article › peer-review

Abstract

For certain crystal orientations and diffraction conditions, X-ray emission intensities can be used to directly determine the composition of specific crystallographic sites.-K.A.R.

Original language	English (US)
Pages (from-to)	61-66
Number of pages	6
Journal	Norelco Reporter
Volume	32
Issue number	2 EM
State	Published - 1985

ASJC Scopus subject areas

General Environmental Science
General Earth and Planetary Sciences

Cite this

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title = "Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope.",

abstract = "For certain crystal orientations and diffraction conditions, X-ray emission intensities can be used to directly determine the composition of specific crystallographic sites.-K.A.R.",

author = "J. Tafto and Buseck, {P R}",

year = "1985",

language = "English (US)",

volume = "32",

pages = "61--66",

journal = "Norelco Reporter",

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T1 - Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope.

AU - Tafto, J.

AU - Buseck, P R

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Y1 - 1985

N2 - For certain crystal orientations and diffraction conditions, X-ray emission intensities can be used to directly determine the composition of specific crystallographic sites.-K.A.R.

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VL - 32

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JO - Norelco Reporter

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ER -

Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope.

Abstract

ASJC Scopus subject areas

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