Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope.

J. Tafto; P R Buseck

Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope.

CLAS-NS: Earth and Space Exploration, School of (SESE)

Research output: Contribution to journal › Article › peer-review

Abstract

For certain crystal orientations and diffraction conditions, X-ray emission intensities can be used to directly determine the composition of specific crystallographic sites.-K.A.R.

Original language	English (US)
Pages (from-to)	61-66
Number of pages	6
Journal	Norelco Reporter
Volume	32
Issue number	2 EM
State	Published - Jan 1 1985

ASJC Scopus subject areas

Environmental Science(all)
Earth and Planetary Sciences(all)

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title = "Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope.",

abstract = "For certain crystal orientations and diffraction conditions, X-ray emission intensities can be used to directly determine the composition of specific crystallographic sites.-K.A.R.",

author = "J. Tafto and Buseck, {P R}",

year = "1985",

month = jan,

day = "1",

language = "English (US)",

volume = "32",

pages = "61--66",

journal = "Norelco Reporter",

issn = "0029-1625",

number = "2 EM",

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T1 - Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope.

AU - Tafto, J.

AU - Buseck, P R

PY - 1985/1/1

Y1 - 1985/1/1

N2 - For certain crystal orientations and diffraction conditions, X-ray emission intensities can be used to directly determine the composition of specific crystallographic sites.-K.A.R.

AB - For certain crystal orientations and diffraction conditions, X-ray emission intensities can be used to directly determine the composition of specific crystallographic sites.-K.A.R.

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VL - 32

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JF - Norelco Reporter

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