Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope.

J. Tafto, P R Buseck

Research output: Contribution to journalArticle

Abstract

For certain crystal orientations and diffraction conditions, X-ray emission intensities can be used to directly determine the composition of specific crystallographic sites.-K.A.R.

Original languageEnglish (US)
Pages (from-to)61-66
Number of pages6
JournalNorelco Reporter
Volume32
Issue number2 EM
StatePublished - Jan 1 1985

ASJC Scopus subject areas

  • Environmental Science(all)
  • Earth and Planetary Sciences(all)

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