Abstract
For certain crystal orientations and diffraction conditions, X-ray emission intensities can be used to directly determine the composition of specific crystallographic sites.-K.A.R.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 61-66 |
| Number of pages | 6 |
| Journal | Norelco Reporter |
| Volume | 32 |
| Issue number | 2 EM |
| State | Published - Jan 1 1985 |
ASJC Scopus subject areas
- Environmental Science(all)
- Earth and Planetary Sciences(all)