Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope.

J. Tafto; P R Buseck

Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope.

CLAS-NS: Earth and Space Exploration, School of (SESE)

Research output: Contribution to journal › Article

Abstract

For certain crystal orientations and diffraction conditions, X-ray emission intensities can be used to directly determine the composition of specific crystallographic sites.-K.A.R.

Original language	English (US)
Pages (from-to)	61-66
Number of pages	6
Journal	Norelco Reporter
Volume	32
Issue number	2 EM
State	Published - Jan 1 1985

ASJC Scopus subject areas

Environmental Science(all)
Earth and Planetary Sciences(all)

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Tafto, J., & Buseck, P. R. (1985). Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope. Norelco Reporter, 32(2 EM), 61-66.

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abstract = "For certain crystal orientations and diffraction conditions, X-ray emission intensities can be used to directly determine the composition of specific crystallographic sites.-K.A.R.",

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