Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope.

J. Tafto; P R Buseck

Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope.

J. Tafto, P R Buseck

Earth and Space Exploration, School of (SESE)

Research output: Contribution to journal › Article › peer-review

15 Scopus citations

Abstract

Electron channelling was used to determine Al-Si ordering in a Madagascar orthoclase. The results, indicating 71% Al occupancy in the T1 site, agreed with previous determinations by diffraction methods. -J.A.Z.

Original language	English (US)
Pages (from-to)	944-950
Number of pages	7
Journal	American Mineralogist
Volume	68
Issue number	9-10
State	Published - Jan 1 1983

ASJC Scopus subject areas

Geophysics
Geochemistry and Petrology

Cite this

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title = "Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope.",

abstract = "Electron channelling was used to determine Al-Si ordering in a Madagascar orthoclase. The results, indicating 71% Al occupancy in the T1 site, agreed with previous determinations by diffraction methods. -J.A.Z.",

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N2 - Electron channelling was used to determine Al-Si ordering in a Madagascar orthoclase. The results, indicating 71% Al occupancy in the T1 site, agreed with previous determinations by diffraction methods. -J.A.Z.

AB - Electron channelling was used to determine Al-Si ordering in a Madagascar orthoclase. The results, indicating 71% Al occupancy in the T1 site, agreed with previous determinations by diffraction methods. -J.A.Z.

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Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope.

Abstract

ASJC Scopus subject areas

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