Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope.

J. Tafto, P R Buseck

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

Electron channelling was used to determine Al-Si ordering in a Madagascar orthoclase. The results, indicating 71% Al occupancy in the T1 site, agreed with previous determinations by diffraction methods. -J.A.Z.

Original languageEnglish (US)
Pages (from-to)944-950
Number of pages7
JournalAmerican Mineralogist
Volume68
Issue number9-10
StatePublished - 1983

Fingerprint

Madagascar
orthoclase
diffraction
feldspar
Electron microscopes
electron microscopes
Diffraction
electron
Electrons
electrons
channelling
method

ASJC Scopus subject areas

  • Geochemistry and Petrology
  • Geophysics

Cite this

Quantitative study of Al-Si ordering in an orthoclase feldspar using an analytical transmission electron microscope. / Tafto, J.; Buseck, P R.

In: American Mineralogist, Vol. 68, No. 9-10, 1983, p. 944-950.

Research output: Contribution to journalArticle

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