Quantitative Moisture Mapping to Determine Local Impacts on Module Durability

Rishi Kumar, Guillaume Von Gastrow, Nicholas Theut, April M. Jeffries, Mariana I. Bertoni, David P. Fenning

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Humidity is widely accepted as a risk factor to the durability of photovoltaic modules. The ingress of moisture from humid environments into the module is linked to a host of module degradation modes, including contact corrosion, encapsulant yellowing, and delamination. While these degradation pathways are studied extensively, the exact moisture content within a module is typically a hidden variable, making it difficult to establish a quantitative relationship between module moisture content and degradation. We leverage our recently developed water reflectomery detection (WaRD) technique along with biased photoluminescence imaging to spatially quantify the moisture content and cell parameters of silicon modules subjected to various damp heat conditions for 2000 hours at a 1 millimeter resolution. This unique dataset reveals two modes of series resistance increase - finger interruptions and cell-wide 'background' resistance - each showing varied sensitivity to moisture exposure depending on module architecture.

Original languageEnglish (US)
Title of host publication2020 47th IEEE Photovoltaic Specialists Conference, PVSC 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1846-1849
Number of pages4
ISBN (Electronic)9781728161150
DOIs
StatePublished - Jun 14 2020
Event47th IEEE Photovoltaic Specialists Conference, PVSC 2020 - Calgary, Canada
Duration: Jun 15 2020Aug 21 2020

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
Volume2020-June
ISSN (Print)0160-8371

Conference

Conference47th IEEE Photovoltaic Specialists Conference, PVSC 2020
CountryCanada
CityCalgary
Period6/15/208/21/20

Keywords

  • Degradation
  • Durability
  • Moisture
  • Silicon

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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