@inproceedings{496454322b934b868b93649ada4ed281,
title = "Quantitative Moisture Mapping to Determine Local Impacts on Module Durability",
abstract = "Humidity is widely accepted as a risk factor to the durability of photovoltaic modules. The ingress of moisture from humid environments into the module is linked to a host of module degradation modes, including contact corrosion, encapsulant yellowing, and delamination. While these degradation pathways are studied extensively, the exact moisture content within a module is typically a hidden variable, making it difficult to establish a quantitative relationship between module moisture content and degradation. We leverage our recently developed water reflectomery detection (WaRD) technique along with biased photoluminescence imaging to spatially quantify the moisture content and cell parameters of silicon modules subjected to various damp heat conditions for 2000 hours at a 1 millimeter resolution. This unique dataset reveals two modes of series resistance increase - finger interruptions and cell-wide 'background' resistance - each showing varied sensitivity to moisture exposure depending on module architecture.",
keywords = "Degradation, Durability, Moisture, Silicon",
author = "Rishi Kumar and {Von Gastrow}, Guillaume and Nicholas Theut and Jeffries, {April M.} and Bertoni, {Mariana I.} and Fenning, {David P.}",
note = "Funding Information: This work was supported by the U.S. Department of Energy{\textquoteright}s Office of Energy Efficiency and Renewable Energy under Solar Energy Technologies Office Agreement DE-EE0008160.(Corresponding author: David P. Fenning.) Funding Information: This material is based upon work supported by the U.S. Department of Energy{\textquoteright}s Office of Energy Efficiency and Renewable Energy (EERE) under Solar Energy Technologies Office (SETO) Agreement Number DE-EE0008160. Publisher Copyright: {\textcopyright} 2020 IEEE. Copyright: Copyright 2021 Elsevier B.V., All rights reserved.; 47th IEEE Photovoltaic Specialists Conference, PVSC 2020 ; Conference date: 15-06-2020 Through 21-08-2020",
year = "2020",
month = jun,
day = "14",
doi = "10.1109/PVSC45281.2020.9300679",
language = "English (US)",
series = "Conference Record of the IEEE Photovoltaic Specialists Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1846--1849",
booktitle = "2020 47th IEEE Photovoltaic Specialists Conference, PVSC 2020",
}