Quantitative measurement and modeling of spontaneous emission efficiency of forward biased multi-junction solar cells

Swee H. Lim, Jing Jing Li, Charles R. Allen, Yong-Hang Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

The spontaneous emission efficiency (η rad) of the subcells in a multi-junction solar cell under forward bias yields information about the subcell material quality. Electroluminesence measurement, calibrated with a technique that takes advantage of the luminescence coupling between subcells, is used to determine η rad as a function of injection current. The InGaAs subcell's η rad is also fitted to a device model using the PC1D drift-diffusion simulation software to extract the SRH lifetime of the p-n junction base region.

Original languageEnglish (US)
Title of host publicationProgram - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011
Pages1721-1725
Number of pages5
DOIs
StatePublished - Dec 1 2011
Event37th IEEE Photovoltaic Specialists Conference, PVSC 2011 - Seattle, WA, United States
Duration: Jun 19 2011Jun 24 2011

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Other

Other37th IEEE Photovoltaic Specialists Conference, PVSC 2011
CountryUnited States
CitySeattle, WA
Period6/19/116/24/11

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Quantitative measurement and modeling of spontaneous emission efficiency of forward biased multi-junction solar cells'. Together they form a unique fingerprint.

  • Cite this

    Lim, S. H., Li, J. J., Allen, C. R., & Zhang, Y-H. (2011). Quantitative measurement and modeling of spontaneous emission efficiency of forward biased multi-junction solar cells. In Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011 (pp. 1721-1725). [6186286] (Conference Record of the IEEE Photovoltaic Specialists Conference). https://doi.org/10.1109/PVSC.2011.6186286