Abstract
We demonstrate ways in which structural information on zeolites can be obtained from high-resolution images and electron diffraction patterns. We employ a commercial slow-scan CCD camera to record the data and demonstrate the advantage of on-line data processing and analysis. Quantitative agreement is obtained between experimental electron diffraction intensities and theoretical calculations. Real-space averaging is a versatile technique which can be employed to reduce the effects of both noise and radiation damage. Under favorable circumstances the weak-phase object approximation can be used to simplify image interpretation and quantification.
Original language | English (US) |
---|---|
Pages (from-to) | 487-498 |
Number of pages | 12 |
Journal | Ultramicroscopy |
Volume | 52 |
Issue number | 3-4 |
DOIs | |
State | Published - Dec 1993 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation