31 Scopus citations

Abstract

We demonstrate ways in which structural information on zeolites can be obtained from high-resolution images and electron diffraction patterns. We employ a commercial slow-scan CCD camera to record the data and demonstrate the advantage of on-line data processing and analysis. Quantitative agreement is obtained between experimental electron diffraction intensities and theoretical calculations. Real-space averaging is a versatile technique which can be employed to reduce the effects of both noise and radiation damage. Under favorable circumstances the weak-phase object approximation can be used to simplify image interpretation and quantification.

Original languageEnglish (US)
Pages (from-to)487-498
Number of pages12
JournalUltramicroscopy
Volume52
Issue number3-4
DOIs
StatePublished - Dec 1993

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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