A correction procedure has been developed to enable the quantitative analysis of Individual unpolished microparticles using the electron microprobe or related electron beam Instruments. Equations expressing the amount of X-ray absorption have been derived for a variety of particle shapes. The effect of electron backscatter on observed X-ray Intensities has been considered. Analytical results are presented using these correction procedures on particles of known compositions. These results show that routine quantitative analysis of microparticles is both feasible and straightforward.
ASJC Scopus subject areas
- Analytical Chemistry