Quantitative characterisation of surfaces and defects on PtRu nanoparticles using combined exit wave restoration and aberration-corrected TEM

Lan-Yun Chang, C. Maunders, E. A. Baranova, C. Bock, G. A. Botton

Research output: Contribution to journalArticle

3 Citations (Scopus)
Original languageEnglish (US)
Pages (from-to)426-427
Number of pages2
JournalMicroscopy and Microanalysis
Volume14
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 1 2008
Externally publishedYes

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Aberrations
restoration
Restoration
aberration
Nanoparticles
Transmission electron microscopy
nanoparticles
Defects
transmission electron microscopy
defects

ASJC Scopus subject areas

  • Instrumentation

Cite this

Quantitative characterisation of surfaces and defects on PtRu nanoparticles using combined exit wave restoration and aberration-corrected TEM. / Chang, Lan-Yun; Maunders, C.; Baranova, E. A.; Bock, C.; Botton, G. A.

In: Microscopy and Microanalysis, Vol. 14, No. SUPPL. 2, 01.08.2008, p. 426-427.

Research output: Contribution to journalArticle

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