Quantitative characterisation of surfaces and defects on PtRu nanoparticles using combined exit wave restoration and aberration-corrected TEM

L. Y. Chang; C. Maunders; E. A. Baranova; C. Bock; G. A. Botton

doi:10.1017/S1431927608086728

Quantitative characterisation of surfaces and defects on PtRu nanoparticles using combined exit wave restoration and aberration-corrected TEM

L. Y. Chang, C. Maunders, E. A. Baranova, C. Bock, G. A. Botton

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	426-427
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	14
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608086728
State	Published - Aug 2008
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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title = "Quantitative characterisation of surfaces and defects on PtRu nanoparticles using combined exit wave restoration and aberration-corrected TEM",

author = "Chang, {L. Y.} and C. Maunders and Baranova, {E. A.} and C. Bock and Botton, {G. A.}",

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publisher = "Cambridge University Press",

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AU - Chang, L. Y.

AU - Maunders, C.

AU - Baranova, E. A.

AU - Bock, C.

AU - Botton, G. A.

PY - 2008/8

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M3 - Article

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Quantitative characterisation of surfaces and defects on PtRu nanoparticles using combined exit wave restoration and aberration-corrected TEM

ASJC Scopus subject areas

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