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Quantification of Sodium-Ion Migration in Silicon Nitride by Flatband-Potential Monitoring at Device-Operating Temperatures
Guillaume von Gastrow, Erick Martinez-Loran, Jonathan Scharf, Jacob Clenney, Rico Meier, Prabhakar Bandaru, Mariana I. Bertoni, David P. Fenning
Research output: Contribution to journal › Article › peer-review
5
Scopus
citations