Abstract
Spectral and angle of incidence (AOI) losses on naturally soiled crystalline silicon photovoltaic (PV) modules have been investigated in this study. The test modules designated as "moderately soiled (3 g/m2 ) " and "heavily soiled (74.6 g/m2)" showed short-circuit current ( Isc losses of about 10% and 41%, respectively. The spectral reflectance and quantum efficiency (QE) losses were also quantitatively determined. In the wavelength range of 350-1100 nm, the average reflectance of moderately and heavily soiled modules increased (as compared with the clean surface) by 58.4% and 87.2%, respectively. In the moderately soiled module, the 26.3% (average) reduction in QE is mainly because of 23% of absorption and 5.5% of reflection in the dust. In the highly soiled module, the 75.3% (average) reduction in QE is mainly because of 62% of absorption and 31% of reflection in the dust particles. It is also seen that the typical critical AOI of 57° for cleaned PV modules decreased to 38° for the moderately soiled module and 20° for the heavily soiled module. This influence is crucial for fixed tilt modules as they experience a wide range of AOI during daily operation, and a significant fraction of energy is generated at higher AOIs.
Original language | English (US) |
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Article number | 7214211 |
Pages (from-to) | 1727-1734 |
Number of pages | 8 |
Journal | IEEE Journal of Photovoltaics |
Volume | 5 |
Issue number | 6 |
DOIs | |
State | Published - Aug 20 2015 |
Keywords
- Angle of incidence (AOI)
- dust
- quantum efficiency (QE)
- reflectance
- soiled photovoltaic (PV) module
- soiling
- spectral loss
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering