TY - JOUR
T1 - Ptychographic X-ray speckle tracking with multi-layer Laue lens systems
AU - Morgan, Andrew J.
AU - Murray, Kevin T.
AU - Prasciolu, Mauro
AU - Fleckenstein, Holger
AU - Yefanov, Oleksandr
AU - Villanueva-Perez, Pablo
AU - Mariani, Valerio
AU - Domaracky, Martin
AU - Kuhn, Manuela
AU - Aplin, Steve
AU - Mohacsi, Istvan
AU - Messerschmidt, Marc
AU - Stachnik, Karolina
AU - Du, Yang
AU - Burkhart, Anja
AU - Meents, Alke
AU - Nazaretski, Evgeny
AU - Yan, Hanfei
AU - Huang, Xiaojing
AU - Chu, Yong S.
AU - Chapmana, Henry N.
AU - Bajt, Sasa
N1 - Funding Information:
Funding for this project was provided by the Australian Research Council Centre of Excellence in Advanced Molecular Imaging (AMI), the Gottfried Wilhelm Leibniz Program of the Deutsche Forschungsgemeinschaft (DFG), the NSF award 1231306 and the Cluster of Excellence ‘CUI: Advanced Imaging of Matter’ of the DFG – EXC 2056 – project ID 390715994. This research used the HXN beamline of the National Synchrotron Light Source II, a US Department of Energy (DOE) Office of Science User Facility
Funding Information:
operated for the DOE Office of Science by Brookhaven National Laboratory under contract No. DE-SC0012704.
Publisher Copyright:
© 2020.
PY - 2020/8/1
Y1 - 2020/8/1
N2 - The ever-increasing brightness of synchrotron radiation sources demands improved X-ray optics to utilize their capability for imaging and probing biological cells, nano-devices and functional matter on the nanometre scale with chemical sensitivity. Hard X-rays are ideal for high-resolution imaging and spectroscopic applications owing to their short wavelength, high penetrating power and chemical sensitivity. The penetrating power that makes X-rays useful for imaging also makes focusing them technologically challenging. Recent developments in layer deposition techniques have enabled the fabrication of a series of highly focusing X-ray lenses, known as wedged multi-layer Laue lenses. Improvements to the lens design and fabrication technique demand an accurate, robust, in situ and at-wavelength characterization method. To this end, a modified form of the speckle tracking wavefront metrology method has been developed. The ptychographic X-ray speckle tracking method is capable of operating with highly divergent wavefields. A useful by-product of this method is that it also provides high-resolution and aberration-free projection images of extended specimens. Three separate experiments using this method are reported, where the ray path angles have been resolved to within 4nrad with an imaging resolution of 45nm (full period). This method does not require a high degree of coherence, making it suitable for laboratory-based X-ray sources. Likewise, it is robust to errors in the registered sample positions, making it suitable for X-ray free-electron laser facilities, where beam-pointing fluctuations can be problematic for wavefront metrology.
AB - The ever-increasing brightness of synchrotron radiation sources demands improved X-ray optics to utilize their capability for imaging and probing biological cells, nano-devices and functional matter on the nanometre scale with chemical sensitivity. Hard X-rays are ideal for high-resolution imaging and spectroscopic applications owing to their short wavelength, high penetrating power and chemical sensitivity. The penetrating power that makes X-rays useful for imaging also makes focusing them technologically challenging. Recent developments in layer deposition techniques have enabled the fabrication of a series of highly focusing X-ray lenses, known as wedged multi-layer Laue lenses. Improvements to the lens design and fabrication technique demand an accurate, robust, in situ and at-wavelength characterization method. To this end, a modified form of the speckle tracking wavefront metrology method has been developed. The ptychographic X-ray speckle tracking method is capable of operating with highly divergent wavefields. A useful by-product of this method is that it also provides high-resolution and aberration-free projection images of extended specimens. Three separate experiments using this method are reported, where the ray path angles have been resolved to within 4nrad with an imaging resolution of 45nm (full period). This method does not require a high degree of coherence, making it suitable for laboratory-based X-ray sources. Likewise, it is robust to errors in the registered sample positions, making it suitable for X-ray free-electron laser facilities, where beam-pointing fluctuations can be problematic for wavefront metrology.
KW - X-ray optics
KW - X-ray speckle tracking
KW - multi-layer Laue lenses
KW - ptychography
KW - wavefront metrology
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U2 - 10.1107/S1600576720006925
DO - 10.1107/S1600576720006925
M3 - Article
AN - SCOPUS:85093882589
SN - 0021-8898
VL - 53
SP - 927
EP - 936
JO - Journal of Applied Crystallography
JF - Journal of Applied Crystallography
ER -