PTSMT: A tool for cross-level power, performance, and thermal exploration of SMT processors

Deepa Kannan, Aseem Gupta, Aviral Shrivastava, Nikil D. Dutt, Fadi J. Kurdahi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Simultaneous Multi-Threading (SMT) processors are becoming popular because they exploit both instruction-level and threadlevel parallelism by issuing instructions from different threads in the same cycle. However, the issues of power and thermal management hinder SMT processors fabricated in nano-scale technologies. Power and thermal issues in SMT processors not only limit the achievable performance, but also have a direct impact on the cost and viability of these processors. While several performance simulation tools to explore the performance aspect of SMT processors early in their design phase exist, there is a lack of early power and performance evaluation tools for SMT processors. To this end, we have developed PTSMT: a tightly coupled power, performance and thermal exploration tool for SMT processors. In this paper, we demonstrate that PTSMT can automatically and effectively accomplish power, performance and thermal exploration of SMT processors at various levels of design hierarchy, at the application level, microarchitecture level, and physical level. Our experimental results show that: at the application level, number of contexts into which an application is divided could affect performance by 2.2x, energy by 52%, and peak temperature by 350C; and at the microarchitecture level, context swapping during run time could reduce energy by 9% and improve performance by 8%. These observations indicate the size of the design space which can be explored using PTSMT.

Original languageEnglish (US)
Title of host publicationProceedings - 21st International Conference on VLSI Design, VLSI DESIGN 2008
Pages421-426
Number of pages6
DOIs
StatePublished - Jul 25 2008
Event21st International Conference on VLSI Design, VLSI DESIGN 2008 - Hyderabad, India
Duration: Jan 4 2008Jan 8 2008

Publication series

NameProceedings of the IEEE International Frequency Control Symposium and Exposition

Other

Other21st International Conference on VLSI Design, VLSI DESIGN 2008
CountryIndia
CityHyderabad
Period1/4/081/8/08

ASJC Scopus subject areas

  • Engineering(all)

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