@article{ec226788f7a6408792f43a3dd858d7f1,
title = "Properties of Dipole-Mode Vibrational Energy Losses Recorded from a TEM Specimen",
abstract = "The authors discuss the dipole vibrational modes that predominate in the energy-loss spectra of ionic materials below 1 eV, concentrating on thin-film specimens of typical transmission electron microscopy (TEM) thickness. The thickness dependence of the intensity is shown to be a useful guide to the bulk or surface character of vibrational peaks. The lateral and depth resolution of the energy-loss signal is investigated with the aid of finite-element calculations.",
keywords = "AEM, EELS, TEM, radiation damage",
author = "Egerton, {Ray F.} and Kartik Venkatraman and Katia March and Crozier, {Peter A.}",
note = "Funding Information: The authors gratefully acknowledge financial support from the Natural Sciences and Engineering Research Council of Canada and from the US National Science Foundation NSF CHE-1508667. We also acknowledge the use of (S)TEM at John M. Cowley Center for High-Resolution Electron Microscopy in the Eyring Materials Center at Arizona State University. Publisher Copyright: Copyright {\textcopyright} Microscopy Society of America 2020.",
year = "2020",
month = dec,
doi = "10.1017/S1431927620024423",
language = "English (US)",
volume = "26",
pages = "1117--1123",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "6",
}