Abstract

The performance of the high-resolution electron microscope has continued to evolve, with recent developments in hardware attachments enabling aberration correction to be directly achieved for both probe-corrected and image-corrected microscope geometries. Sub-Ångstrom resolution, once regarded as an unattainable dream, can nowadays be readily achieved with instruments that are being widely sold commercially. These instrumentation developments have played a central role in facilitating transformational advances in imaging (and analytical) capability, bringing both novel opportunities and fresh challenges for the electron microscopy community. This paper provides a short update of recent progress in atomic-resolution TEM and STEM imaging, and briefly discusses some of the associated issues and problems attracting close attention.

Original languageEnglish (US)
Pages (from-to)504-508
Number of pages5
JournalMicron
Volume43
Issue number4
DOIs
StatePublished - Mar 2012

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Scanning Transmission Electron Microscopy
Electron Microscopy
Electrons

Keywords

  • Aberration correction
  • Atomic-resolution electron microscopy
  • Information limit
  • Microscope performance
  • Spherical aberration

ASJC Scopus subject areas

  • Cell Biology
  • Structural Biology

Cite this

Progress and problems for atomic-resolution electron microscopy. / Smith, David.

In: Micron, Vol. 43, No. 4, 03.2012, p. 504-508.

Research output: Contribution to journalArticle

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