Abstract

The transmission electron microscope (TEM) has evolved into a highly sophisticated instrument that is ideally suited to the characterization of advanced materials. Atomic-level information is routinely accessible using both fixed-beam and scanning TEMs. This report briefly considers developments in the field of atomic-resolution electron microscopy. Recent activities include renewed attention to on-line microscope control ('autotuning'), and assessment and correction of aberrations. Aberration-corrected electron microscopy has developed rapidly in several forms although more work needs to be done to identify standard imaging conditions and to explore novel operating modes. Preparation of samples and image interpretation have also become more demanding. Ongoing problems include discrepancies between measured and simulated image contrast, concerns about radiation damage, and inversion of electron scattering.

Original languageEnglish (US)
Pages (from-to)10-16
Number of pages7
JournalMaterials Today
Volume12
Issue numberSUPPL.
DOIs
StatePublished - 2009

Fingerprint

Aberrations
Electron microscopy
aberration
electron microscopy
Electron scattering
Radiation damage
image contrast
radiation damage
electron scattering
Microscopes
Electron microscopes
electron microscopes
microscopes
inversions
Transmission electron microscopy
Scanning
Imaging techniques
preparation
transmission electron microscopy
scanning

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering
  • Mechanics of Materials

Cite this

Progress & perspectives for atomic-resolution electron microscopy. / Smith, David.

In: Materials Today, Vol. 12, No. SUPPL., 2009, p. 10-16.

Research output: Contribution to journalArticle

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