Probabilistic fatigue life prediction using an equivalent initial flaw size distribution

Yongming Liu, Sankaran Mahadevan

Research output: Contribution to journalArticle

138 Citations (Scopus)

Abstract

A new methodology is proposed in this paper to calculate the equivalent initial flaw size (EIFS) distribution. The proposed methodology is based on the Kitagawa-Takahashi diagram. Unlike the commonly used back-extrapolation method for EIFS calculation, the proposed methodology is independent of applied load level and only uses fatigue limit and fatigue crack threshold stress intensity factor. The advantage of the proposed EIFS concept is that it is very efficient in calculating the statistics of EIFS. The developed EIFS methodology is combined with probabilistic crack growth analysis to predict the fatigue life of smooth specimens. Model predictions are compared with experimental observations for various metallic materials.

Original languageEnglish (US)
Pages (from-to)476-487
Number of pages12
JournalInternational Journal of Fatigue
Volume31
Issue number3
DOIs
StatePublished - Mar 2009
Externally publishedYes

Fingerprint

Fatigue Life Prediction
Fatigue of materials
Defects
Methodology
Growth Analysis
Fatigue Limit
Extrapolation Method
Fatigue Crack
Crack Growth
Fatigue Life
Stress Intensity Factor
Extrapolation
Stress intensity factors
Prediction Model
Crack propagation
Diagram
Statistics
Calculate
Predict

Keywords

  • Crack growth
  • Fatigue
  • Initial flaw
  • Life prediction
  • Reliability

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering
  • Mechanical Engineering
  • Mechanics of Materials
  • Materials Science(all)
  • Modeling and Simulation

Cite this

Probabilistic fatigue life prediction using an equivalent initial flaw size distribution. / Liu, Yongming; Mahadevan, Sankaran.

In: International Journal of Fatigue, Vol. 31, No. 3, 03.2009, p. 476-487.

Research output: Contribution to journalArticle

@article{124aba9b3e934830937f621bd4eee491,
title = "Probabilistic fatigue life prediction using an equivalent initial flaw size distribution",
abstract = "A new methodology is proposed in this paper to calculate the equivalent initial flaw size (EIFS) distribution. The proposed methodology is based on the Kitagawa-Takahashi diagram. Unlike the commonly used back-extrapolation method for EIFS calculation, the proposed methodology is independent of applied load level and only uses fatigue limit and fatigue crack threshold stress intensity factor. The advantage of the proposed EIFS concept is that it is very efficient in calculating the statistics of EIFS. The developed EIFS methodology is combined with probabilistic crack growth analysis to predict the fatigue life of smooth specimens. Model predictions are compared with experimental observations for various metallic materials.",
keywords = "Crack growth, Fatigue, Initial flaw, Life prediction, Reliability",
author = "Yongming Liu and Sankaran Mahadevan",
year = "2009",
month = "3",
doi = "10.1016/j.ijfatigue.2008.06.005",
language = "English (US)",
volume = "31",
pages = "476--487",
journal = "International Journal of Fatigue",
issn = "0142-1123",
publisher = "Elsevier Limited",
number = "3",

}

TY - JOUR

T1 - Probabilistic fatigue life prediction using an equivalent initial flaw size distribution

AU - Liu, Yongming

AU - Mahadevan, Sankaran

PY - 2009/3

Y1 - 2009/3

N2 - A new methodology is proposed in this paper to calculate the equivalent initial flaw size (EIFS) distribution. The proposed methodology is based on the Kitagawa-Takahashi diagram. Unlike the commonly used back-extrapolation method for EIFS calculation, the proposed methodology is independent of applied load level and only uses fatigue limit and fatigue crack threshold stress intensity factor. The advantage of the proposed EIFS concept is that it is very efficient in calculating the statistics of EIFS. The developed EIFS methodology is combined with probabilistic crack growth analysis to predict the fatigue life of smooth specimens. Model predictions are compared with experimental observations for various metallic materials.

AB - A new methodology is proposed in this paper to calculate the equivalent initial flaw size (EIFS) distribution. The proposed methodology is based on the Kitagawa-Takahashi diagram. Unlike the commonly used back-extrapolation method for EIFS calculation, the proposed methodology is independent of applied load level and only uses fatigue limit and fatigue crack threshold stress intensity factor. The advantage of the proposed EIFS concept is that it is very efficient in calculating the statistics of EIFS. The developed EIFS methodology is combined with probabilistic crack growth analysis to predict the fatigue life of smooth specimens. Model predictions are compared with experimental observations for various metallic materials.

KW - Crack growth

KW - Fatigue

KW - Initial flaw

KW - Life prediction

KW - Reliability

UR - http://www.scopus.com/inward/record.url?scp=56249130742&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=56249130742&partnerID=8YFLogxK

U2 - 10.1016/j.ijfatigue.2008.06.005

DO - 10.1016/j.ijfatigue.2008.06.005

M3 - Article

VL - 31

SP - 476

EP - 487

JO - International Journal of Fatigue

JF - International Journal of Fatigue

SN - 0142-1123

IS - 3

ER -