Abstract
The Schottky barrier height of intimate Cu/GaAs (110), Ag/GaAs (110), and Fe/GaAs (100) has been measured as a function of hydrostatic pressure. The pressure dependence of the Cu and Ag/n-GaAs barrier heights of 97±4 meV/GPa fall within the uncertainty of the pressure dependence of the AsGa defect and track the predicted value of AsGa-rich interfaces. In contrast, the pressure dependence of the Fe/n-GaAs(100) Schottky barrier height of 109±7 meV/GPa does not fall within experimental error of these values and falls at nearly the predicted dependence of defect-free interfaces.
Original language | English (US) |
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Article number | 045322 |
Pages (from-to) | 453221-453226 |
Number of pages | 6 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 64 |
Issue number | 4 |
State | Published - Jul 15 2001 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics