In this work, a diffusion-reaction model was implemented and used to study Cu migration during the annealing process and stress test. Its impact on the metastable behavior of CdTe solar cells was also investigated. The preliminary results support our theoretical model presented here that explains rapid changes in atomic concentration of Cu in CdTe as a function of stress conditions.

Original languageEnglish (US)
Title of host publication2016 International Reliability Physics Symposium, IRPS 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467391368
StatePublished - Sep 22 2016
Event2016 International Reliability Physics Symposium, IRPS 2016 - Pasadena, United States
Duration: Apr 17 2016Apr 21 2016

Publication series

NameIEEE International Reliability Physics Symposium Proceedings
ISSN (Print)1541-7026


Other2016 International Reliability Physics Symposium, IRPS 2016
CountryUnited States


  • CdTe
  • Cu
  • numerical simulation
  • photovoltaic

ASJC Scopus subject areas

  • Engineering(all)

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