@inproceedings{e8fe2b171abb4dfb988974bfeefa63d4,
title = "Preditive simulation of defect migration and metastabilities in CdTe solar cells",
abstract = "In this work, a diffusion-reaction model was implemented and used to study Cu migration during the annealing process and stress test. Its impact on the metastable behavior of CdTe solar cells was also investigated. The preliminary results support our theoretical model presented here that explains rapid changes in atomic concentration of Cu in CdTe as a function of stress conditions.",
keywords = "CdTe, Cu, numerical simulation, photovoltaic",
author = "Da Guo and Richard Akis and Daniel Brinkman and Dragica Vasileska and Andrew Moore",
note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 2016 International Reliability Physics Symposium, IRPS 2016 ; Conference date: 17-04-2016 Through 21-04-2016",
year = "2016",
month = sep,
day = "22",
doi = "10.1109/IRPS.2016.7574522",
language = "English (US)",
series = "IEEE International Reliability Physics Symposium Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "3C11--3C15",
booktitle = "2016 International Reliability Physics Symposium, IRPS 2016",
}